High-resolution electron microscopy and X-ray diffraction characterization of alternately strained (GaAs)n (Gap)m (GaAs)n (InP)m superlattices grown by atomic layer molecular beam epitaxy

1994 ◽  
Vol 69 (5) ◽  
pp. 871-880
Author(s):  
C. Ballesteros ◽  
D. Gerthsen ◽  
A. Mazuelas ◽  
A. Ruiz ◽  
F. Briones
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Atomic Layer ◽  
High Resolution Electron Microscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Resolution Electron

Quantitative characterization of epitaxial superlattices by x‐ray diffraction and high resolution electron microscopy

1993 ◽  
Vol 63 (4) ◽  
pp. 482-484 ◽  
Author(s):  
Eric E. Fullerton ◽  
Wei Cao ◽  
Gareth Thomas ◽  
Ivan K. Schuller ◽  
Matthew J. Carey ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
X Ray Diffraction ◽  
Quantitative Characterization ◽  
X Ray ◽  
Resolution Electron

Double Periodicity Formation in EuTe/PbTe Superlattices

1995 ◽  
Vol 399 ◽  
Author(s):  
M. Shima ◽  
L. Salamanca-Riba ◽  
G. Springholz ◽  
G. Bauer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Short Period ◽  
Short Period Superlattices

ABSTRACTMolecular beam epitaxy was used to grow EuTe(x)/PbTe(y) short period superlattices with x=1-4 EuTe(111) monolayers alternating with y≈3x PbTe monolayers. The superlattices were characterized by transmission electron microscopy and high resolution x-ray diffraction. Regions with double periodicity were observed coexisting with areas of nominal periodicity. The sample with x=3.5 and y=9, for example, contains regions with double periodicity of x=7 and y=17. X-ray diffraction measurements confirm the formation of the double periodicity in these samples by the appearance of weak satellites in between the satellites of the nominal periodicity. The double periodicity in the superlattice is believed to result from interdiffusion during the growth. A model for this process is presented.

High Resolution Electron Microscopy of a Novel Zeolite

1997 ◽  
Vol 3 (S2) ◽  
pp. 441-442
Author(s):  
P.A. Crozier ◽  
I.Y. Chan ◽  
C.Y. Chen ◽  
L.W. Finger ◽  
R.C. Medrud ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Low Dose ◽  
High Resolution Electron Microscopy ◽  
X Ray Diffraction ◽  
High Adsorption ◽  
Structural Units ◽  
X Ray ◽  
Resolution Electron ◽  
Crystal Structural

Low-dose high resolution electron microscopy (HREM) is a useful technique for elucidating the structure of zeolites. In recent years a number of zeolite structures have been solved using combinations of different characterization techniques including adsorption measurements, powder x-ray diffraction and low-dose high resolution electron microscopy (for example see ref. 2). We have used these techniques to study the structure of a novel zeolite material. However, great care must be exercised when interpreting data from these techniques in terms of crystal structural units. In this particular case, the structure was recently determined using single crystal x-ray diffraction and showed some surprises.Details of the synthesis of this zeolite are given elsewhere. The high adsorption capacity suggested that this zeolite possessed two interpenetrating channels (either a 10 and a 12 ring or two 12 ring channels). X-ray powder diffraction showed the material to be monoclinic with a= 18.5Å, b= 13.4 Å, c= 7.6 Å β = 101.5°).

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