The darkening effects of secondary electron image due to superconductivity in Y1BA2CU3O7-xfilms

1992 ◽  
Vol 128 (1) ◽  
pp. 243-248 ◽  
Author(s):  
Ludmila Kokhanchik ◽  
Alexey Nikulov ◽  
Anatoly Chernykh
Keyword(s):  
Secondary Electron ◽  
Secondary Electron Image ◽  
Electron Image

Analysis on Resistance Change Mechanism of NiO-ReRAM Using Visualization Technique of Data Storage Area With Secondary Electron Image

2010 ◽  
Vol 1250 ◽  
Author(s):  
Kentaro Kinoshita ◽  
Tatsuya Makino ◽  
Yoda Takatoshi ◽  
Dobashi Kazufumi ◽  
Kishida Satoru
Keyword(s):  
Data Storage ◽  
Secondary Electron ◽  
High Resistance State ◽  
Secondary Electron Image ◽  
Resistance Change ◽  
Force Microscopy ◽  
Electron Image ◽  
Storage Area ◽  
Resistance State ◽  
Pt Films

AbstractBoth a low resistance state and a high resistance state which were written by the voltage application in a local region of NiO/Pt films by using conducting atomic force microscopy (C-AFM) were observed by using scanning electron microscope (SEM) and electron probe micro analysis (EPMA). The writing regions are distinguishable as dark areas in a secondary electron image and thus can be specified without using complicated sample fabrication process to narrow down the writing regions such as the photolithography technique. In addition, the writing regions were analyzed by using energy dispersive X-ray spectroscopy (EDS) mapping. No difference between the inside and outside of the writing regions is observed for all the mapped elements including C and Rh. Here, C and Rh are the most probable candidates for contamination which affect the secondary electron image. Therefore, our results suggested that the observed change in the contrast of the second electron image is related to the intrinsic change in the electronic state of the NiO film and a secondary electron yield is correlated to the physical properties of the film.

Analysis on data storage area of NiO-ReRAM with secondary electron image

2011 ◽  
Vol 26 (1) ◽  
pp. 45-49 ◽  
Author(s):  
K. Kinoshita ◽  
T. Makino ◽  
T. Yoda ◽  
K. Dobashi ◽  
S. Kishida
Keyword(s):  
Data Storage ◽  
Secondary Electron ◽  
Secondary Electron Image ◽  
Electron Image ◽  
Storage Area ◽  
Image Position

Abstract

Sign in / Sign up

Export Citation Format

Share Document