scholarly journals Multivacancy Effects in Atomic and Molecular Spectra

1986 ◽  
Vol 39 (5) ◽  
pp. 845 ◽  
Author(s):  
Richard D Deslattes

Chemical applications of X-ray spectra are inhibited by the general occurrence of multivacancy processes. These manifest themselves in emission �spectra as extra lines (or satellites) while opening of channels to these initial configurations leads to extra detail in absorption spectra. While there are a few simple cases where this situation has been more or less fully discussed, the more interesting areas are those which are both not simple and not understood. There is, however, a fairly general experimental procedure by which this .complex situation could, in principle, be clarified. This involves carrying out high resolution emission spectroscopy as a function of exciting photon energy in regions containing both single and multiple vacancy thresholds. In earlier work summarised here, it was possible to demonstrate the procedure for a monatomic gas, argon. Subsequently, we have built and now operate a beamline designed specifically for such studies at the National Synchrotron Light Source (NSLS) in Brookhaven. Very recent results from this line and from a few experiments using conventional sources are summarised.

2009 ◽  
Vol 1203 ◽  
Author(s):  
Jen Bohon ◽  
John Smedley ◽  
Erik M. Muller ◽  
Jeffrey W. Keister

AbstractHigh quality single crystal and polycrystalline CVD diamond detectors with platinum contacts have been tested at the white beam X28C beamline at the National Synchrotron Light Source under high-flux conditions. The voltage dependence of these devices has been measured under DC and pulsed-bias conditions, establishing the presence or absence of photoconductive gain in each device. Linear response has been achieved over eleven orders of magnitude when combined with previous low flux studies. Temporal measurements with single crystal diamond detectors have resolved the ns scale pulse structure of the NSLS.


2017 ◽  
Vol 24 (6) ◽  
pp. 1113-1119 ◽  
Author(s):  
E. Nazaretski ◽  
H. Yan ◽  
K. Lauer ◽  
N. Bouet ◽  
X. Huang ◽  
...  

A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ∼15 nm × 15 nm spatial resolution using multilayer Laue lenses and 25 nm × 26 nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90 K and 1000 K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities.


2009 ◽  
Vol 4 (03) ◽  
pp. P03014-P03014 ◽  
Author(s):  
G A Carini ◽  
W Chen ◽  
A Dragone ◽  
J Fried ◽  
J Jakoncic ◽  
...  

1979 ◽  
Vol 26 (3) ◽  
pp. 3806-3808 ◽  
Author(s):  
S. Krinsky ◽  
L. Blumberg ◽  
J. Bittner ◽  
J. Galayda ◽  
R. Heese ◽  
...  

2002 ◽  
Vol 09 (01) ◽  
pp. 185-191 ◽  
Author(s):  
C. JACOBSEN ◽  
T. BEETZ ◽  
M. FESER ◽  
A. OSANNA ◽  
A. STEIN ◽  
...  

Soft X-ray microscopy allows one to study nanoscale heterogeneities in dry and wet environmental science, biological, polymer, and geochemical specimens. Recent advances in instrumentation at the X-1A beamline at the National Synchrotron Light Source at Brookhaven National Laboratory are described. Spectromicroscopy data analysis methods including component mapping and principal component analysis (PCA) are then discussed.


1999 ◽  
Author(s):  
Betsy A. Dowd ◽  
Graham H. Campbell ◽  
Robert B. Marr ◽  
Vivek V. Nagarkar ◽  
Sameer V. Tipnis ◽  
...  

1984 ◽  
Author(s):  
John M. Kenney ◽  
Janos Kirz ◽  
Harvey Rarback ◽  
Ralph Feder ◽  
David Sayre ◽  
...  

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