The Reconstruction of Displacement Fields of Defects in Crystals from Electron Micrographs
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It is shown that the theorem of Part I, namely, that there is a unique reversible connection between displacement fields and electron micrographs for the case of two-beam diffraction and analytic displacement fields, can be extended to many-beam diffraction conditions. The case of a systematic set of diffracting vectors is parallel to the two-beam case with a unique reversible connection between one component of the displacement field and one micrograph. In the general many-beam case there is a unique reversible connection between the vector displacement field and three micrographs.
2006 ◽
Vol 306-308
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pp. 357-362
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2012 ◽
Vol 446-449
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pp. 3596-3603
1995 ◽
Vol 449
(1937)
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pp. 537-554
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2021 ◽
2021 ◽
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