scholarly journals Auger Spectroscopy and Surface Analysis

1997 ◽  
Vol 50 (4) ◽  
pp. 745 ◽  
Author(s):  
S. M. Thurgate

Abstract In 1925 Pierre Auger reported on his observations of low energy electrons associated with core-ionised atoms in cloud chamber experiments. He was able to correctly identify the mechanism for their production, and such electrons are now known as Auger electrons. Typically Auger electrons have energies in the range 10 eV to 2 keV. The short distance that such low energy electrons travel in solids ensures that Auger electrons come from the surface layers. The data generated by the AES technique are complex. There are at least three electrons involved in the process, and there are many possible configurations for the atom. These possibilities led to spectra that are not readily interpreted in detail. Theory lags behind experiment in this area. In principle, it should be possible to find information about the chemical environment of atoms from Auger spectra. While there are clear changes in spectral lineshapes, there is no simple way to go from the spectra to an understanding of the chemical bonding of the atom. There are a number of experiments currently underway which aim to improve our understanding of the Auger process. Synchrotron experiments with tunable energy x-rays are providing new insight. Experiments that use positrons to excite Auger emission have also produced further recent understanding. Coincidence experiments between photoelectrons and Auger electrons have also made recent advances. Auger photoelectron coincidence spectroscopy reduces the complexity of Auger spectra by only counting those electrons that occur as a consequence of selected ionisations. The effect is to reduce the complexity of the spectra, and to isolate processes that are often clouded by the simultaneous occurrence of other effects.

1969 ◽  
Vol 13 ◽  
pp. 418-425
Author(s):  
L. I Yin ◽  
L. Adler ◽  
R. E. Lamothe

The possibility of obtaining Auger spectra excited by a Po 210 α-source has been investigated. The obvious advantages in the use of radioactive α-sources are simplicity, stability, and high ionization cross section for light elements. Typical spectra obtained with this method, as well as parameters affecting the characteristics of these spectra, are presented and discussed The following observations have been made: the intense low energy continuum background make it difficult to detect the presence of Auger lines in this region; the abundance of Auger lines in the above region makes identification difficult; the intensity of higher energy Auger lines is too low to be observed with the present α-source and low vacuum system; thus the practicability of α-excited Auger spectroscopy will need further investigation.


2001 ◽  
Vol 7 (S2) ◽  
pp. 268-269
Author(s):  
J.C.H. Spence ◽  
U. Weierstall ◽  
J. Fries

Recent experiments with X-rays and high energy electrons have shown that image recovery from diffracted intensities is possible for non-periodic objects using iterative algorithms. Application of these methods to biological molecules raises the crucial problem of radiation damage, which may be quantified by Q = ΔE σi/σe, the amount of energy deposited by inelastic events per elastic event. Neutrons, helium atoms and low energy electrons below most ionization thresholds produce the smallest values of Q (see for TMV imaged at 60 eV). For neutrons (λ = 10-2Å, and deuterated, 15N-abelled molecules) Q is ∼3000 times smaller (∼50 times for λ = 1.8Å) than for electrons (80- 500keV) and about 4x 106 times smaller than for soft X-rays (1.5Å). Since σe for neutrons is about 105 times smaller than for electrons (and about 10 times smaller than for soft X-rays), a 105 times higher neutron dose is required to obtain the same S/N in a phase contrast image compared with electrons, if other noise sources are absent.


Author(s):  
Gary G. Hembree ◽  
Frank C. H. Luo ◽  
John A. Venables

A new UHV-STEM has been developed for the NSF-HREM facility at Arizona State University. In this instrument low energy (0-2 keV) electrons can be collected through the objective lens from both sides of thin (STEM) samples, or from the input side of bulk (SEM) samples. As explained in more detail elsewhere, we use magnetic parallelizers to control the angular compression of the emitted secondary and Auger electrons, which spiral around the B-field lines. The parallelizers have axial fields of about 100 G, and compress all these emitted electrons into a cone of less than 6 deg. The sample may be biassed negatively by a few hundred volts, which enables us to compress the cone angle further and to observe the sample using biassed secondary electron imaging (b-SEI). At the exit aperture of the parallelizer the low energy electrons are deflected slightly off-axis by a Wien (E × B) filter to separate them from the the 100 keV beam.


2005 ◽  
Vol 11 (6) ◽  
pp. 562-566
Author(s):  
Olga R. Zheltysheva ◽  
Dmitry V. Surnin ◽  
Dmitry E. Guy ◽  
Faat Z. Gil'mutdinov ◽  
Yuri V. Ruts ◽  
...  

The surfaces of crystalline samples of 3d-metals (Mn, Fe, Co, Ni, and Cu) and their stoichiometric oxides have been studied by Auger spectroscopy. A correlation between the change in the LVV (L-inner level-valence-valence electron transition) Auger intensities and the change of the squares of the corresponding atomic-magnetic moments has been observed. This is because of the complicated nature of the Auger process. That is, the Auger electron emission is a result of the inner atomic level excitation by electron impact and Auger annihilation of the inner-level hole. Therefore, the Auger process has been considered a second-order process, and spin polarization of the valence states has been taken into account for the LMM (L-inner level-M-inner level-M-inner level electron transition) Auger spectra of 3d-metals.


1997 ◽  
Vol 42 (3) ◽  
pp. 318-321
Author(s):  
A. T. Kozakov ◽  
A. V. Nikol’skii

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