Nonlinear waves in a thin dielectric film on the surface of a topological insulator

2020 ◽  
Vol 50 (12) ◽  
pp. 1110-1114
Author(s):  
A.I. Maimistov ◽  
E.I. Lyashko ◽  
S.O. Elyutin
Keyword(s):  
Topological Insulator ◽  
Nonlinear Waves ◽  
Dielectric Film ◽  
Thin Dielectric Film

Effect of an Atomically Thin Dielectric Film on the Surface Electron Dynamics: Image-Potential States in theAr/Cu(100)System

2002 ◽  
Vol 89 (4) ◽  
Author(s):  
D. C. Marinica ◽  
C. Ramseyer ◽  
A. G. Borisov ◽  
D. Teillet-Billy ◽  
J. P. Gauyacq ◽  
...  
Keyword(s):  
Dielectric Film ◽  
Electron Dynamics ◽  
Surface Electron ◽  
Thin Dielectric Film

Control of SiO2/Si interface defects generation during thin dielectric film etching using CHxFy/Ar/O2plasma

2015 ◽  
Vol 54 (6S2) ◽  
pp. 06GB05 ◽  
Author(s):  
Takushi Shigetoshi ◽  
Masanaga Fukasawa ◽  
Kazunori Nagahata ◽  
Tetsuya Tatsumi
Keyword(s):  
Dielectric Film ◽  
Thin Dielectric Film ◽  
Interface Defects

Tuning the properties of ALD-ZnO-based rectifying structures by thin dielectric film insertion – Modeling and experimental studies

2017 ◽  
Vol 693 ◽  
pp. 1164-1173 ◽  
Author(s):  
Tomasz A. Krajewski ◽  
Petro S. Smertenko ◽  
Grzegorz Luka ◽  
Dymitr Snigurenko ◽  
Krzysztof Kopalko ◽  
...  
Keyword(s):  
Dielectric Film ◽  
Experimental Studies ◽  
Thin Dielectric Film

TE-polarized waves guided by a nonlinear thin dielectric film bounded by a nonlinear cladding

1990 ◽  
Vol 74 (4) ◽  
pp. 275-279 ◽  
Author(s):  
D. Mihalache ◽  
D. Mazilu ◽  
W. Biehlig ◽  
U. Langbein ◽  
F. Lederer ◽  
...  
Keyword(s):  
Dielectric Film ◽  
Thin Dielectric Film ◽  
Polarized Waves

scholarly journals Sensitivity of resonance frequency in the detection of thin layer using nano-slit structures

2020 ◽  
Author(s):  
Junshan Lin ◽  
Sang-Hyun Oh ◽  
Hai Zhang
Keyword(s):  
Thin Layer ◽  
Resonance Frequency ◽  
Evanescent Wave ◽  
Dielectric Film ◽  
Ambient Medium ◽  
Thin Layers ◽  
Aperture Size ◽  
Thin Dielectric Film ◽  
Resonance Frequencies ◽  
Wave Modes

Abstract We derive the formulas for the resonance frequencies and their sensitivity when the nano-slit structures are used in the detection of thin layers. For a thin layer with a thickness of $H$ deposited over the nanostructure, we show quantitatively that for both single and periodic slit structures with slit aperture size $\delta $, the sensitivity of resonance frequency reduces as $H$ increases. Specifically, the sensitivity is of order $O(\delta /H)$ if $H>\delta $ and of order $O(1+\ln H/\delta )$ otherwise. The evanescent wave modes are present along the interface between the thin dielectric film and ambient medium above. From the mathematical derivations, it is observed that the sensitivity of the resonance frequency highly depends on the effect of evanescent wave modes on the tiny slit apertures.

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