The Integration of Orientation Information in the Motion Correspondence Problem

Perception ◽  
10.1068/p3049 ◽  
2001 ◽  
Vol 30 (3) ◽  
pp. 367-380 ◽  
Author(s):  
Simon Prince ◽  
Shani Offen ◽  
Bruce G Cumming ◽  
Richard A Eagle
Perception ◽  
1995 ◽  
Vol 24 (11) ◽  
pp. 1233-1245 ◽  
Author(s):  
Terry Palmer ◽  
Ovid J L Tzeng ◽  
Sheng He

This study addressed the ‘correspondence’ problem of apparent-motion (AM) perception in which parts of a scene must be matched with counterparts separated in time and space. Given evidence that AM correspondence can be mediated by two distinct processes—one based on a low-level motion-detection mechanism (the Reichardt process), the other involving the tracking of objects by visual attention (the attention-based process)—the present study explored how these processes interact in the perception of apparent motion between hierarchically structured figures. In three experiments, hierarchical figures were presented in a competition motion display so that, across frames, figures were identical at either the local or the global level. In experiment 1 it was shown that AM occurred between locally identical figures. Furthermore, with the Reichardt AM component eliminated in experiments 3 and 4, no preference was obtained for either level. While evidence from previous studies suggests that form extraction for hierarchically structured figures proceeds from the global to the local level, the present results indicate the irrelevance of such a global precedence in AM correspondence. In addition, it is suggested that Reichardt AM correspondence between local elements constrains attention-based AM correspondence between global figures so that both components move in the same direction. It is argued that this constraining process represents an elegant means of achieving AM correspondence between objects undergoing complex transformations.


2000 ◽  
Vol 267 (1450) ◽  
pp. 1369-1374 ◽  
Author(s):  
Paul B. Hibbard ◽  
Mark F. Bradshaw ◽  
Richard A. Eagle

1999 ◽  
Vol 39 (2) ◽  
pp. 373-385 ◽  
Author(s):  
Richard A. Eagle ◽  
Maarten A. Hogervorst ◽  
Andrew Blake

Author(s):  
Jonathan Ogle ◽  
Daniel Powell ◽  
Eric Amerling ◽  
Detlef Matthias Smilgies ◽  
Luisa Whittaker-Brooks

<p>Thin film materials have become increasingly complex in morphological and structural design. When characterizing the structure of these films, a crucial field of study is the role that crystallite orientation plays in giving rise to unique electronic properties. It is therefore important to have a comparative tool for understanding differences in crystallite orientation within a thin film, and also the ability to compare the structural orientation between different thin films. Herein, we designed a new method dubbed the mosaicity factor (MF) to quantify crystallite orientation in thin films using grazing incidence wide-angle X-ray scattering (GIWAXS) patterns. This method for quantifying the orientation of thin films overcomes many limitations inherent in previous approaches such as noise sensitivity, the ability to compare orientation distributions along different axes, and the ability to quantify multiple crystallite orientations observed within the same Miller index. Following the presentation of MF, we proceed to discussing case studies to show the efficacy and range of application available for the use of MF. These studies show how using the MF approach yields quantitative orientation information for various materials assembled on a substrate.<b></b></p>


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