Impact ionization-induced bistability in CMOS transistors at cryogenic temperatures for capacitorless memory applications
2018 ◽
Vol 6
◽
pp. 996-1006
◽
2018 ◽
Vol 18
(3)
◽
pp. 456-462
1991 ◽
Vol 49
◽
pp. 54-55
1994 ◽
Vol 52
◽
pp. 586-587
1981 ◽
Vol 42
(C4)
◽
pp. C4-1115-C4-1121
2011 ◽
Vol E94-C
(5)
◽
pp. 712-716
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