scholarly journals A flexible system-on-a-chip control hardware for atomic, molecular, and optical physics experiments

2021 ◽  
Vol 92 (10) ◽  
pp. 105103
Author(s):  
A. Trenkwalder ◽  
M. Zaccanti ◽  
N. Poli
Keyword(s):  
Flexible System ◽  
System On A Chip ◽  
Physics Experiments

New Silicon Frontiers: Physically Flexible System-On-A-Chip

2017 ◽  
Author(s):  
Richard L. Chaney ◽  
Dale G. Wilson ◽  
Douglas R. Hackler ◽  
Kelly J. DeGregorio ◽  
Darrell E. Leber
Keyword(s):  
Flexible System ◽  
System On A Chip

‘Flexible’ system makes pet food production easy

1984 ◽  
Vol 63 (8) ◽  
pp. 23
Author(s):  
Stephen Margolis
Keyword(s):  
Food Production ◽  
Pet Food ◽  
Flexible System

ILL FACILITIES FOR FUNDAMENTAL PHYSICS EXPERIMENTS

1984 ◽  
Vol 45 (C3) ◽  
pp. C3-279-C3-284 ◽  
Author(s):  
P. Ageron ◽  
W. Mampe
Keyword(s):  
Fundamental Physics ◽  
Physics Experiments

Development of Silicon Sensor Characterization System for Future High Energy Physics Experiments

2015 ◽  
Vol 3 (1) ◽  
pp. 41-45
Author(s):  
Preeti Kumari ◽  
◽  
Kavita Lalwani ◽  
Ranjit Dalal ◽  
Ashutosh Bhardwaj ◽  
...  
Keyword(s):  
High Energy Physics ◽  
High Energy ◽  
Physics Experiments ◽  
Silicon Sensor ◽  
Energy Physics

Localization of a Complex Failure by Combining ATPG and Customer-Oriented Application Testing

2013 ◽  
Author(s):  
Kai Wang ◽  
Rhys Weaver ◽  
David Johnson
Keyword(s):  
Failure Analysis ◽  
Semiconductor Device ◽  
Digital Design ◽  
Radio Communication ◽  
Communication Failure ◽  
Systemic Analysis ◽  
Rf Communication ◽  
System On A Chip ◽  
Electrical Diagnostics ◽  
Failure Location

Abstract A systemic analysis was chosen to evaluate a real case Bluetooth (BT) radio failure in the aspects of RF communication, digital design, firmware, application software, semiconductor device physics and processing, and failure analysis. This paper explores the range of testing, including customer application testing, required to confirm and localize a BT RF communication failure. It shows that the radio communication failure was not, as expected, caused by faulty radio hardware; it was rather linked to problematic encryption hardware at the assistance of the Synergy BT to mobile application. The paper also explores that the digital fault can only be detected by the timing sensitive transition fault scan patterns and how to obtain the physical failure location. Thus, the combination of ATPG and application testing provides a consistency between electrical diagnostics which yields a higher success rate at subsequent physical failure analysis of complex modern RF System on a Chip.

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