Cryogen-free scanning gate microscope for the characterization of Si/Si0.7Ge0.3 quantum devices at milli-Kelvin temperatures
2020 ◽
Vol 30
(7)
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pp. 1-4
Keyword(s):
2016 ◽
Vol 65
(8)
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pp. 1827-1835
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2010 ◽
Vol 10
(10)
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pp. 6779-6782
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Keyword(s):
2004 ◽
pp. 297-332
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Keyword(s):