Integrated atomic force microscopy and x-ray irradiation for in situ characterization of radiation-induced processes

2021 ◽  
Vol 92 (11) ◽  
pp. 113701
Author(s):  
Shawn L. Riechers ◽  
Nikolai Petrik ◽  
John S. Loring ◽  
Mark K. Murphy ◽  
Carolyn I. Pearce ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
In Situ Characterization ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Radiation Induced

scholarly journals Review—Multiscale Characterization of Li-Ion Batteries through the Combined Use of Atomic Force Microscopy and X-ray Microscopy and Considerations for a Correlative Analysis of the Reviewed Data

2021 ◽  
Author(s):  
Danilo Dini ◽  
Flavio Cognigni ◽  
Daniele Passeri ◽  
Francesca Anna Scaramuzzo ◽  
Mauro Pasquali ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Correlative Analysis ◽  
Atomic Force ◽  
Combined Use ◽  
Complementary Techniques ◽  
Non Destructive

Abstract The present review analyses the recent literature on the combined use of X-ray microscopy (XRM) and atomic force microscopy (AFM) for multiscale characterization of Li+ (or Li) batteries (LiBs) with the aim of developing guidelines for correlative analysis. The usefulness of XRM resides in the capability of affording non invasively in situ images of the inner parts of a LiB (an encapsulated device) with spatial resolution of dozens of nm during operation. XRM is non destructive and affords the early diagnosis of LiBs degradation causes when these manifest themselves as microdeformations. Multiscale characterization of LiBs also requires AFM for visualizing the morphological/physical alterations of LiB components (anodes, cathodes, electrolyte) at the sub-nanometer level. Different to XRM, AFM necessitates of a modification of LiB working configuration since AFM uses a contacting probe whereas XRM exploits radiation-matter interactions and does not require LiB dissection. A description of the working principles of the two techniques is provided to evidence which technical aspects have to be considered for achieving a meaningful correlative analysis of LiBs. In delineating new perspectives for the analysis of LiBs we will consider additional complementary techniques. Among various AFM-based techniques particular emphasis is given to electrochemical AFM (EC-AFM).

In Situ Characterization of the Mechanical Behavior of Gecko's Spatulae by Atomic Force Microscopy

2013 ◽  
Vol 22 ◽  
pp. 85-93
Author(s):  
Shuang Yi Liu ◽  
Min Min Tang ◽  
Ai Kah Soh ◽  
Liang Hong
Keyword(s):  
Mechanical Behavior ◽  
Hierarchical Level ◽  
Intrinsic Properties ◽  
In Situ Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Theoretical Predictions ◽  
Multi Mode

In-situ characterization of the mechanical behavior of geckos spatula has been carried out in detail using multi-mode AFM system. Combining successful application of a novel AFM mode, i.e. Harmonix microscopy, the more detail elastic properties of spatula is brought to light. The results obtained show the variation of the mechanical properties on the hierarchical level of a seta, even for the different locations, pad and stalk of the spatula. A model, which has been validated using the existing experimental data and phenomena as well as theoretical predictions for geckos adhesion, crawling and self-cleaning of spatulae, is proposed in this paper. Through contrast of adhesive and craw ability of the gecko on the surfaces with different surface roughness, and measurement of the surface adhesive behaviors of Teflon, the most effective adhesion of the gecko is more dependent on the intrinsic properties of the surface which is adhered.

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force
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