scholarly journals Prompt acceleration of a short-lifetime low-energy muon beam

2021 ◽  
Vol 28 (9) ◽  
pp. 093101
Author(s):  
Xiao-Nan Wang ◽  
Xiao-Fei Lan ◽  
Yong-Sheng Huang ◽  
Hao Zhang ◽  
Tong-Pu Yu
Keyword(s):  
Muon Beam ◽  
Low Energy ◽  
Short Lifetime

The low energy muon beam profile monitor for the muon g−2/EDM experiment at J-PARC

2017 ◽  
Vol 12 (09) ◽  
pp. C09001-C09001 ◽  
Author(s):  
G.P. Razuvaev ◽  
S. Bae ◽  
H. Choi ◽  
S. Choi ◽  
H.S. Ko ◽  
...  
Keyword(s):  
Muon Beam ◽  
Beam Profile ◽  
Low Energy ◽  
Beam Profile Monitor

scholarly journals A New High-intensity, Low-momentum Muon Beam for the Generation of Low-energy Muons at PSI

2005 ◽  
Vol 159 (1-4) ◽  
pp. 385-388 ◽  
Author(s):  
T. Prokscha ◽  
E. Morenzoni ◽  
K. Deiters ◽  
F. Foroughi ◽  
D. George ◽  
...  
Keyword(s):  
High Intensity ◽  
Muon Beam ◽  
Low Energy

scholarly journals A New High-Intensity, Low-Momentum Muon Beam for the Generation of Low-Energy Muons at PSI

HFI/NQI 2004 ◽  
2008 ◽  
pp. 812-815
Author(s):  
T. Prokscha ◽  
E. Morenzoni ◽  
K. Deiters ◽  
F. Foroughi ◽  
D. George ◽  
...  
Keyword(s):  
High Intensity ◽  
Muon Beam ◽  
Low Energy

scholarly journals Conventional to slow muon microscopy – a review

BIBECHANA ◽  
2020 ◽  
Vol 17 ◽  
pp. 139-145
Author(s):  
Amba Datt Pant
Keyword(s):  
Muon Beam ◽  
Low Energy ◽  
Energy Spread ◽  
Future Prospects ◽  
Bulk Properties ◽  
Spin Polarized

Because of special characteristics (fully spin polarized and asymmetric decay to positron), muon acts as sensitive probe to study the local electronic and dynamics of materials. The muon of energy MeV or high, conventional muon, are used to study bulk properties of the materials. For the study of nanoscience, slow muon (20 eV - 30 keV) muon with low energy spread are essential that leads to development of slow muon microscopy. Introduction to muon microscopy, application of conventional muons and need of slow muon beam along with future prospects are briefly discussed.  BIBECHANA 17 (2020) 139-145

scholarly journals muCool: a novel low-energy muon beam for future precision experiments

2019 ◽  
Vol 240 (1) ◽  
Author(s):  
Ivana Belosevic ◽  
Aldo Antognini ◽  
Yu Bao ◽  
Andreas Eggenberger ◽  
Malte Hildebrandt ◽  
...  
Keyword(s):  
Muon Beam ◽  
Low Energy

Prospects for ultra-low-energy muon beam at J-PARC

2009 ◽  
Vol 600 (1) ◽  
pp. 35-37 ◽  
Author(s):  
Pavel Bakule ◽  
Yasuyuki Matsuda ◽  
Yasuhiro Miyake ◽  
Kanetada Nagamine ◽  
Koichiro Shimomura ◽  
...  
Keyword(s):  
Muon Beam ◽  
Low Energy

The new high-intensity surface muon beam for the generation of low-energy muons at PSI

2006 ◽  
Vol 374-375 ◽  
pp. 460-463 ◽  
Author(s):  
T. Prokscha ◽  
E. Morenzoni ◽  
K. Deiters ◽  
F. Foroughi ◽  
D. George ◽  
...  
Keyword(s):  
High Intensity ◽  
Muon Beam ◽  
Low Energy ◽  
Surface Muon

Dissociated Σ=27 boundaries in silicon

1988 ◽  
Vol 46 ◽  
pp. 624-625
Author(s):  
A. Garg ◽  
W.A.T. Clark ◽  
J.P. Hirth
Keyword(s):  
Electron Diffraction ◽  
Local Minimum ◽  
Boundary Energy ◽  
Coincidence Site Lattice ◽  
Boundary Plane ◽  
Low Energy ◽  
Theoretical Understanding ◽  
Site Lattice ◽  
Kikuchi Pattern ◽  
Analysis Techniques

In the last twenty years, a significant amount of work has been done in the theoretical understanding of grain boundaries. The various proposed grain boundary models suggest the existence of coincidence site lattice (CSL) boundaries at specific misorientations where a periodic structure representing a local minimum of energy exists between the two crystals. In general, the boundary energy depends not only upon the density of CSL sites but also upon the boundary plane, so that different facets of the same boundary have different energy. Here we describe TEM observations of the dissociation of a Σ=27 boundary in silicon in order to reduce its surface energy and attain a low energy configuration.The boundary was identified as near CSL Σ=27 {255} having a misorientation of (38.7±0.2)°/[011] by standard Kikuchi pattern, electron diffraction and trace analysis techniques. Although the boundary appeared planar, in the TEM it was found to be dissociated in some regions into a Σ=3 {111} and a Σ=9 {122} boundary, as shown in Fig. 1.

Transfer optics for high spatial resolution electron spectroscopy

1988 ◽  
Vol 46 ◽  
pp. 666-667
Author(s):  
G. G. Hembree ◽  
Luo Chuan Hong ◽  
P.A. Bennett ◽  
J.A. Venables
Keyword(s):  
Magnetic Field ◽  
Scanning Transmission Electron Microscope ◽  
Low Energy ◽  
Objective Lens ◽  
State University ◽  
Arizona State University ◽  
Initial Field ◽  
Resolution Electron ◽  
Scanning Transmission ◽  
Low Energy Electrons

A new field emission scanning transmission electron microscope has been constructed for the NSF HREM facility at Arizona State University. The microscope is to be used for studies of surfaces, and incorporates several surface-related features, including provision for analysis of secondary and Auger electrons; these electrons are collected through the objective lens from either side of the sample, using the parallelizing action of the magnetic field. This collimates all the low energy electrons, which spiral in the high magnetic field. Given an initial field Bi∼1T, and a final (parallelizing) field Bf∼0.01T, all electrons emerge into a cone of semi-angle θf≤6°. The main practical problem in the way of using this well collimated beam of low energy (0-2keV) electrons is that it is travelling along the path of the (100keV) probing electron beam. To collect and analyze them, they must be deflected off the beam path with minimal effect on the probe position.

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