Oxygen and vacancy defects in silicon. A quantum mechanical characterization through the IR and Raman spectra
Keyword(s):
1996 ◽
Vol 100
(5)
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pp. 1559-1568
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1996 ◽
Vol 100
(13)
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pp. 5578-5589
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2016 ◽
Vol 688
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pp. 692-698
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2009 ◽
Vol 110
(2)
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pp. 416-421
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2019 ◽
Vol 21
(37)
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pp. 20939-20950
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1993 ◽
Vol 48
(12)
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pp. 1781-1783
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1994 ◽
Vol 328
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pp. 121-132
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1995 ◽
Vol 348
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pp. 349-352
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