scholarly journals Study on scattering light field distribution of optical element in-surface defects based on Mueller matrix

AIP Advances ◽  
2021 ◽  
Vol 11 (11) ◽  
pp. 115114
Author(s):  
Hongjun Wang ◽  
Yingge Zhang ◽  
Dasen Wang ◽  
Bingcai Liu ◽  
Xueliang Zhu ◽  
...  
Keyword(s):  
Field Distribution ◽  
Light Field ◽  
Surface Defects ◽  
Optical Element ◽  
Mueller Matrix ◽  
Scattering Light

Constructing a light-field distribution for the laser guiding of atoms in photonic crystals

2000 ◽  
Vol 184 (5-6) ◽  
pp. 391-396 ◽  
Author(s):  
A.V. Tarasishin ◽  
S.A. Magnitskii ◽  
V.A. Shuvaev ◽  
A.M. Zheltikov
Keyword(s):  
Photonic Crystals ◽  
Field Distribution ◽  
Light Field ◽  
Laser Guiding

Numerical Simulation Research on Scattering Light Imaging of Surface Defects of Optical Components

2015 ◽  
Vol 42 (7) ◽  
pp. 0708005 ◽  
Author(s):  
王世通 Wang Shitong ◽  
杨甬英 Yang Yongying ◽  
赵丽敏 Zhao Limin ◽  
柴惠婷 Chai Huiting ◽  
刘东 Liu Dong ◽  
...  
Keyword(s):  
Numerical Simulation ◽  
Surface Defects ◽  
Optical Components ◽  
Simulation Research ◽  
Scattering Light

Correction of CCD noise in light field distribution measurement

2011 ◽  
Vol 23 (9) ◽  
pp. 2346-2350
Author(s):  
刘立力 Liu Lili ◽  
达争尚 Da Zhengshang ◽  
田新锋 Tian Xinfeng ◽  
段亚轩 Duan Yaxuan ◽  
李东坚 Li Dongjian ◽  
...  
Keyword(s):  
Field Distribution ◽  
Light Field ◽  
Distribution Measurement

The dual-injection Ge-on-Si photodetectors with high saturation power by optimizing light field distribution

2021 ◽  
Vol 480 ◽  
pp. 126467
Author(s):  
Jishi Cui ◽  
Tiantian Li ◽  
Fenghe Yang ◽  
Wenjing Cui ◽  
Hongmin Chen
Keyword(s):  
Field Distribution ◽  
Light Field ◽  
High Saturation ◽  
Saturation Power ◽  
Dual Injection

scholarly journals Measuring the Mueller matrix of an arbitrary optical element with a universal SU(2) polarization gadget

2014 ◽  
Vol 31 (3) ◽  
pp. 610 ◽  
Author(s):  
Salla Gangi Reddy ◽  
Shashi Prabhakar ◽  
A. Aadhi ◽  
Ashok Kumar ◽  
Megh Shah ◽  
...  
Keyword(s):  
Optical Element ◽  
Mueller Matrix

Интеллектуальные системы оценки качества обработки резьбовых поверхностей и контроля дефектов на основе цифровой регистрации светового поля

2020 ◽  
pp. 46-57
Author(s):  
Ю. Ольт ◽  
В.В. Максаров ◽  
В.Е. Махов
Keyword(s):  
Defect Detection ◽  
Morphological Analysis ◽  
Light Field ◽  
Surface Defects ◽  
Intelligent System ◽  
Practical Implementation ◽  
Programmable Logic ◽  
Intelligent Algorithms ◽  
Geometrical Characteristics ◽  
Geometrical Dimensions

This article considers topical matters of building an intelligent system for evaluating threaded surface treatment and defect detection in the process of manufacturing critical articles based on light field (LF) registration. The article includes algorithms and methods of monitoring principal geometrical dimensions, shape and surface defects using images obtained from an LF recorder by applying the methods of digitalization the obtained images and morphological analysis of image layers. This article proposes practical implementation of the developed algorithm on the National Instruments software platform using intelligent algorithms on the principle of programmable logic. The article proves that the accuracy of the results of determining geometrical characteristics using the proposed solutions makes it possible to automate the process of monitoring defect detection in critical and high-load threaded surfaces in the process of cutting materials.

A large depth of field frontal multi-projection three-dimensional display with uniform light field distribution

2015 ◽  
Vol 354 ◽  
pp. 321-329 ◽  
Author(s):  
Peng Wang ◽  
Songlin Xie ◽  
Xinzhu Sang ◽  
Duo Chen ◽  
Chenyu Li ◽  
...  
Keyword(s):  
Field Distribution ◽  
Light Field ◽  
Three Dimensional ◽  
Depth Of Field ◽  
Large Depth ◽  
Three Dimensional Display
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