Observations of visible argon line emissions and its spatial profile from Aditya-U tokamak plasma

2021 ◽  
Vol 92 (5) ◽  
pp. 053548
Author(s):  
K. Shah ◽  
J. Ghosh ◽  
G. Shukla ◽  
M. B. Chowdhuri ◽  
R. Manchanda ◽  
...  
Atoms ◽  
2019 ◽  
Vol 7 (3) ◽  
pp. 87
Author(s):  
Nandini Yadava ◽  
Joydeep Ghosh ◽  
Malay Bikas Chowdhuri ◽  
Ranjana Manchanda ◽  
Sripathi Punchithaya K ◽  
...  

The spatial profile of neutral hydrogen temperatures in Aditya-U tokamak plasma has been estimated from the spatial profile of the Hα spectral emissions measured using a high-resolution multi-track spectrometer, having a spectral resolution of 0.023 nm at a 50 μm entrance slit width. The neutral temperature estimation from the Doppler broadened spectral line was carried out after considering the Zeeman effect due to the magnetic field present in the tokamak. To accurately obtain the temperature of the neutral hydrogen, two temperature components (warm and hot) were required to be considered. A code was developed to obtain the neutral temperature and is used to analyze two typical plasma discharges. The temperature of warm components varies between 3 and 5 eV, while hot atoms have temperatures in the range of 15–30 eV. It was observed that the chord-integrated neutral temperature increases slightly towards the plasma core region compared to the plasma edge of Aditya-U tokamak.


Author(s):  
R. J. Wilson ◽  
D. D. Chambliss ◽  
S. Chiang ◽  
V. M. Hallmark

Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral resolution in STM depends upon the spatial profile of electronic states of both the sample and tip at energies near the Fermi level. Vertical resolution is typically limited by mechanical and electronic noise.


2020 ◽  
Vol 27 (12) ◽  
pp. 122302
Author(s):  
Shrish Raj ◽  
N. Bisai ◽  
Vijay Shankar ◽  
A. Sen
Keyword(s):  

2001 ◽  
Vol 44 (3) ◽  
pp. 311-315
Author(s):  
Kseniya A Razumova

1986 ◽  
Vol 87 ◽  
Author(s):  
R. P. Silberstein ◽  
D. J. Larson

AbstractWe have studied the spatial profile of the thermal transients that occur during and following the current pulsing associated with Peltier Interface Demarcation during directional solidification. Results for pure Bi are presented in detail and compared with corresponding results for the Bi/MnBi eutectic. Significant thermal transients occur throughout the sample that can be accounted for by the Peltier effect, the Thomson effect, and Joule heating. We have separated these effects and studied their behavior as a function of time, current density, and position with respect to the solid/liquid interface.


2013 ◽  
Vol 111 (26) ◽  
Author(s):  
W. L. Zhong ◽  
X. L. Zou ◽  
C. Bourdelle ◽  
S. D. Song ◽  
J. F. Artaud ◽  
...  

1992 ◽  
Vol 45 (4) ◽  
pp. 336-339 ◽  
Author(s):  
F P Keenan ◽  
K M Aggarwal ◽  
K A Berrington
Keyword(s):  

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