Vector measurements using all optical scalar atomic magnetometers

Rui Zhang; Rahul Mhaskar; Ken Smith; Easswar Balasubramaniam; Mark Prouty

doi:10.1063/5.0037991

Vector measurements using all optical scalar atomic magnetometers

Journal of Applied Physics ◽

10.1063/5.0037991 ◽

2021 ◽

Vol 129 (4) ◽

pp. 044502

Author(s):

Rui Zhang ◽

Rahul Mhaskar ◽

Ken Smith ◽

Easswar Balasubramaniam ◽

Mark Prouty

Keyword(s):

All Optical ◽

Optical Scalar

Download Full-text

An all-optical scalar and vector spin-exchange relaxation-free magnetometer employing on–off pump modulation

Journal of Applied Physics ◽

10.1063/1.3536673 ◽

2011 ◽

Vol 109 (7) ◽

pp. 07E507 ◽

Cited By ~ 9

Author(s):

Alexander Gusarov ◽

David Levron ◽

Andrei Ben-Amar Baranga ◽

Eugene Paperno ◽

Reuben Shuker

Keyword(s):

Spin Exchange ◽

Off Pump ◽

All Optical ◽

Optical Scalar

Download Full-text

Correlation analysis of radiation damage

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100108210 ◽

1978 ◽

Vol 36 (1) ◽

pp. 214-215

Author(s):

R. Hegerl ◽

A. Feltynowski ◽

B. Grill

Keyword(s):

Electron Microscopy ◽

Independent Random Variables ◽

Optical Parameters ◽

Bright Field Image ◽

Bright Field ◽

Expectation Value ◽

All Optical ◽

Image Element ◽

Stochastic Series ◽

The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

Download Full-text