scholarly journals Dual-mode auto-calibrating resistance thermometer: A novel approach with Johnson noise thermometry

2021 ◽  
Vol 92 (3) ◽  
pp. 034901
Author(s):  
D. Drung ◽  
C. Krause
Author(s):  
Nathan E. Flowers-Jacobs ◽  
Alessio Pollarolo ◽  
Kevin J. Coakley ◽  
Adam C. Weis ◽  
Anna E. Fox ◽  
...  

In preparation for the redefinition of the International System of Units (SI), five different electronic measurements of the Boltzmann constant have been performed using different Johnson noise thermometry (JNT) systems over the past seven years. In this paper, we describe in detail the JNT system and uncertainty components associated with the most recent National Institute of Standards and Technology (NIST) determination of the Boltzmann constant: k = 1.380642 9(69) × 10−23 J/K, with a relative standard uncertainty of 5.0 × 10−6 and relative offset of −4.05 × 10−6 from the Committee on Data for Science and Technology (CODATA) 2014 recommended value. We discuss the input circuits and the approach we used to match the frequency response of two noise sources. We present new measurements of the correlated noise of the 4 K on-chip resistors in the quantum-accurate, pseudorandom, voltage-noise source, which we used to estimate the correlated, frequency-dependent, nonthermal noise in our system. Finally, we contrast our system with those used in other measurements and speculate on future improvements.


Metrologia ◽  
2017 ◽  
Vol 54 (4) ◽  
pp. 549-558 ◽  
Author(s):  
Jifeng Qu ◽  
Samuel P Benz ◽  
Kevin Coakley ◽  
Horst Rogalla ◽  
Weston L Tew ◽  
...  

Metrologia ◽  
2015 ◽  
Vol 52 (5) ◽  
pp. S242-S256 ◽  
Author(s):  
Jifeng Qu ◽  
Samuel P Benz ◽  
Alessio Pollarolo ◽  
Horst Rogalla ◽  
Weston L Tew ◽  
...  

2015 ◽  
Vol 106 (2) ◽  
pp. 023121 ◽  
Author(s):  
Jesse Crossno ◽  
Xiaomeng Liu ◽  
Thomas A. Ohki ◽  
Philip Kim ◽  
Kin Chung Fong

2005 ◽  
Vol 54 (2) ◽  
pp. 653-657 ◽  
Author(s):  
S.W. Nam ◽  
S.P. Benz ◽  
P.D. Dresselhaus ◽  
C.J. Burroughs ◽  
W.L. Tew ◽  
...  

2014 ◽  
Vol 507 (4) ◽  
pp. 042023 ◽  
Author(s):  
Masaaki Maezawa ◽  
Takahiro Yamada ◽  
Chiharu Urano

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