Effect of lithium doping in the optical and structural properties of zinc oxide films by SILAR method

2020 ◽  
Author(s):  
Gopika Anandanpillai Sreedevi ◽  
Sreehari Sreekumar ◽  
Rakhesh Vamadevan
Keyword(s):  
Zinc Oxide ◽  
Structural Properties ◽  
Oxide Films ◽  
Silar Method ◽  
Lithium Doping ◽  
Zinc Oxide Films

Variations in optical and structural properties of zinc oxide films after laser processing

2016 ◽  
Vol 61 (11) ◽  
pp. 1744-1746 ◽  
Author(s):  
D. N. Redka ◽  
N. V. Mukhin ◽  
I. G. Zakharov
Keyword(s):  
Zinc Oxide ◽  
Structural Properties ◽  
Laser Processing ◽  
Oxide Films ◽  
Zinc Oxide Films

Structural properties of non-stoichiometric zinc oxide films

1987 ◽  
Vol 22 (10) ◽  
pp. 3611-3614 ◽  
Author(s):  
M. J. Brett ◽  
R. R. Parsons
Keyword(s):  
Zinc Oxide ◽  
Structural Properties ◽  
Oxide Films ◽  
Zinc Oxide Films

Optical and structural properties of zinc oxide films with different thicknesses prepared by successive ionic layer adsorption and reaction method

2011 ◽  
Vol 520 (4) ◽  
pp. 1358-1362 ◽  
Author(s):  
Ahmet Taner ◽  
Metin Kul ◽  
Evren Turan ◽  
A. Şenol Aybek ◽  
Muhsin Zor ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Structural Properties ◽  
Oxide Films ◽  
Reaction Method ◽  
Zinc Oxide Films ◽  
Layer Adsorption ◽  
Ionic Layer

Analysis of Sputtered Zinc Oxide Films

1980 ◽  
Vol 38 ◽  
pp. 416-417
Author(s):  
T. A. Emma ◽  
M. P. Singh
Keyword(s):  
Electron Microscopy ◽  
Zinc Oxide ◽  
Piezoelectric Materials ◽  
Oxide Films ◽  
Optical Quality ◽  
Zno Films ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Sputtered Films ◽  
Zinc Oxide Films

Optical quality zinc oxide films have been characterized using reflection electron diffraction (RED), replication electron microscopy (REM), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Significant microstructural differences were observed between rf sputtered films and planar magnetron rf sputtered films. Piezoelectric materials have been attractive for applications to integrated optics since they provide an active medium for signal processing. Among the desirable physical characteristics of sputtered ZnO films used for this and related applications are a highly preferred crystallographic texture and relatively smooth surfaces. It has been found that these characteristics are very sensitive to the type and condition of the substrate and to the several sputtering parameters: target, rf power, gas composition and substrate temperature.

Properties of Transparent Conductive Zinc Oxide Films Deposited on COP Substrates by PLD Method

2009 ◽  
Vol 129 (11) ◽  
pp. 1981-1984
Author(s):  
Yuki Ueno ◽  
Takanori Aoki ◽  
Akio Suzuki ◽  
Tatsuhiko Matsushita ◽  
Masahiro Okuda
Keyword(s):  
Zinc Oxide ◽  
Oxide Films ◽  
Zinc Oxide Films
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