Ultra-thin Hf0.5Zr0.5O2 thin-film-based ferroelectric tunnel junction via stress induced crystallization

2020 ◽  
Vol 117 (24) ◽  
pp. 242901
Author(s):  
Youngin Goh ◽  
Junghyeon Hwang ◽  
Yongsun Lee ◽  
Minki Kim ◽  
Sanghun Jeon
1990 ◽  
Vol 165-166 ◽  
pp. 103-104 ◽  
Author(s):  
Anders Larsen ◽  
Hans Dalsgaard Jensen ◽  
Jesper Mygind

2018 ◽  
Vol 113 (17) ◽  
pp. 172405 ◽  
Author(s):  
M. Ye. Zhuravlev ◽  
Artem Alexandrov ◽  
L. L. Tao ◽  
Evgeny Y. Tsymbal

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