A non-invasive gating method for probing 2D electron systems on pristine, intrinsic H-Si(111) surfaces
1988 ◽
Vol 46
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pp. 998-999
2001 ◽
Vol 120
(5)
◽
pp. A491-A491
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Keyword(s):
2006 ◽
Vol 175
(4S)
◽
pp. 300-300
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Keyword(s):
2006 ◽
Vol 2006
◽
pp. 26-27
Keyword(s):