Bench tests of a helium ion source for the neutral particle diagnostic system of the ITER tokamak

2020 ◽  
Vol 91 (12) ◽  
pp. 123301
Author(s):  
A. D. Melnik ◽  
V. I. Afanasyev ◽  
V. I. Davydenko ◽  
A. V. Kolmogorov ◽  
M. I. Mironov ◽  
...  
Keyword(s):  
Neutral Particle ◽  
Diagnostic System ◽  
Ion Source ◽  
Bench Tests ◽  
Helium Ion ◽  
Particle Diagnostic

Development of a Manufacturing Technology for Detectors of the Neutral Particle Diagnostic System on the Tokamak

2020 ◽  
Vol 63 (2) ◽  
pp. 205-208
Author(s):  
A. D. Melnik ◽  
V. I. Afanasyev ◽  
S. S. Kozlovsky ◽  
M. I. Mironov ◽  
A. S. Navolotsky ◽  
...  
Keyword(s):  
Neutral Particle ◽  
Diagnostic System ◽  
Manufacturing Technology ◽  
Particle Diagnostic

Design Features of the Neutral Particle Diagnostic System for the ITER Tokamak

2017 ◽  
Vol 80 (7) ◽  
pp. 1268-1278 ◽  
Author(s):  
S. Ya. Petrov ◽  
V. I. Afanasyev ◽  
A. D. Melnik ◽  
M. I. Mironov ◽  
A. S. Navolotsky ◽  
...  
Keyword(s):  
Neutral Particle ◽  
Diagnostic System ◽  
Design Features ◽  
Particle Diagnostic

scholarly journals DESIGN FEATURES OF NEUTRAL PARTICLE DIAGNOSTIC SYSTEM FOR ITER

2016 ◽  
Vol 39 (1) ◽  
pp. 68-80
Author(s):  
S.Ya. Petrov ◽  
◽  
V.I. Afanasyev ◽  
A.D. Melnik ◽  
M.I. Mironov ◽  
...  
Keyword(s):  
Neutral Particle ◽  
Diagnostic System ◽  
Design Features ◽  
Particle Diagnostic

scholarly journals NEUTRON COLLIMATOR FOR NEUTRAL PARTICLE DIAGNOSTIC SYSTEM FOR ITER

2020 ◽  
Vol 43 (2) ◽  
pp. 38-48
Author(s):  
A.S. Navolotsky ◽  
◽  
V.I. Afanasyev ◽  
A.D. Melnik ◽  
M.I. Mironov ◽  
...  
Keyword(s):  
Neutral Particle ◽  
Diagnostic System ◽  
Particle Diagnostic

scholarly journals DESIGN FEATURES OF NEUTRAL PARTICLE DIAGNOSTIC SYSTEM FOR ITER

2016 ◽  
Vol 39 (1) ◽  
pp. 67-80
Author(s):  
S.Ya. Petrov ◽  
◽  
V.I. Afanasyev ◽  
A.D. Melnik ◽  
M.I. Mironov ◽  
...  
Keyword(s):  
Neutral Particle ◽  
Diagnostic System ◽  
Design Features ◽  
Particle Diagnostic

scholarly journals Spatial resolved high-energy particle diagnostic system using time-of-flight neutral particle analyzer in large helical device

2003 ◽  
Vol 74 (3) ◽  
pp. 1878-1882 ◽  
Author(s):  
Tetsuo Ozaki ◽  
Sadayoshi Murakami ◽  
Pavel Goncharov ◽  
Tsuguhiro Watanabe ◽  
Shigeru Sudo ◽  
...  
Keyword(s):  
Neutral Particle ◽  
Time Of Flight ◽  
Diagnostic System ◽  
High Energy ◽  
High Energy Particle ◽  
Energy Particle ◽  
Neutral Particle Analyzer ◽  
Particle Diagnostic

Neutron Collimator for the Diagnostic System of Neutral Particle Analyzers of the ITER Tokamak

2021 ◽  
Vol 84 (7) ◽  
pp. 1296-1304
Author(s):  
A. S. Navolotsky ◽  
V. I. Afanasyev ◽  
A. D. Melnik ◽  
M. I. Mironov ◽  
V. G. Nesenevich ◽  
...  
Keyword(s):  
Neutral Particle ◽  
Diagnostic System

The Helium Ion Microscope for High Resolution Imaging, Materials Analysis, Circuit Edit and FA Applications

2009 ◽  
Author(s):  
William B. Thompson ◽  
John Notte ◽  
Larry Scipioni ◽  
Mohan Ananth ◽  
Lewis Stern ◽  
...  
Keyword(s):  
Ion Source ◽  
Injection System ◽  
Analysis Tool ◽  
High Resolution Imaging ◽  
Ion Imaging ◽  
Materials Analysis ◽  
Ion Optics ◽  
Helium Ion ◽  
Scanning Transmission ◽  
Resolution Imaging

Abstract Currently, the helium ion microscope (HIM) can be operated in three imaging modes; ion induced secondary electron (SE) mode, Rutherford backscatter imaging (RBI) mode, and scanning transmission ion imaging (STIM) mode. This paper will provide an overview of microscope’s ion source, its ion optics, the system architecture, the fundamentals of these three imaging modes and many FA related examples. Recently integrated with the microscope are a Rutherford Backscatter (RBS) detector for materials analysis and a gas injection system (GIS) for material modification. We will describe this new hardware and suggest how these additions could also contribute to the helium ion microscope being an important failure analysis tool.

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