scholarly journals The effect of laser entrance hole foil thickness on MagLIF-relevant laser preheat

2020 ◽  
Vol 27 (11) ◽  
pp. 113301
Author(s):  
A. J. Harvey-Thompson ◽  
M. R. Weis ◽  
D. E. Ruiz ◽  
M. S. Wei ◽  
A. B. Sefkow ◽  
...  
Keyword(s):  
Foil Thickness ◽  
Entrance Hole

The Effect of Specimen Thickness and Probe Size on Aem Analysis of Cr-Depletion Profiles in Sensitized Stainless Steel

1982 ◽  
Vol 40 ◽  
pp. 518-519
Author(s):  
E. L. Hall
Keyword(s):  
Grain Boundaries ◽  
Boundary Region ◽  
Chromium Concentration ◽  
Foil Thickness ◽  
Specimen Thickness ◽  
Probe Size ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Sensitization Process ◽  
Compositional Gradients

Sensitization in stainless steels is caused by the formation of chromium-rich M23C6 carbides at grain boundaries, which depletes the adjacent matrix and boundary region of chromium, and hence leads to rapid intergranular attack. To fully understand the sensitization process, and to test the accuracy of theories proposed to model this process, it is necessary to obtain very accurate measurements of the chromium concentration at grain boundaries in sensitized specimens. Quantitative X-ray spectroscopy in the analytical electron microscope (AEM) enables the chromium concentration profile across these boundaries to be studied directly; however, it has been shown that a strong effect of foil thickness and electron probe size may be present in the analysis of rapidly-changing compositional gradients. The goal of this work is to examine these effects.

Influence of X-Ray Induced Fluorescence on Energy Dispersive X-Ray Analysis of Thin Foils

1977 ◽  
Vol 35 ◽  
pp. 328-329
Author(s):  
E. A. Kenik ◽  
J. Bentley
Keyword(s):  
Thin Foil ◽  
Electron Excitation ◽  
Simple Approach ◽  
Foil Thickness ◽  
X Rays ◽  
X Ray ◽  
Hole Spectrum ◽  
Illumination System ◽  
Thin Foils ◽  
Intensity Ratios

Cliff and Lorimer (1) have proposed a simple approach to thin foil x-ray analy sis based on the ratio of x-ray peak intensities. However, there are several experimental pitfalls which must be recognized in obtaining the desired x-ray intensities. Undesirable x-ray induced fluorescence of the specimen can result from various mechanisms and leads to x-ray intensities not characteristic of electron excitation and further results in incorrect intensity ratios.In measuring the x-ray intensity ratio for NiAl as a function of foil thickness, Zaluzec and Fraser (2) found the ratio was not constant for thicknesses where absorption could be neglected. They demonstrated that this effect originated from x-ray induced fluorescence by blocking the beam with lead foil. The primary x-rays arise in the illumination system and result in varying intensity ratios and a finite x-ray spectrum even when the specimen is not intercepting the electron beam, an ‘in-hole’ spectrum. We have developed a second technique for detecting x-ray induced fluorescence based on the magnitude of the ‘in-hole’ spectrum with different filament emission currents and condenser apertures.

Cell structure properties during in situ creep experiments in the H.V.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 574-575
Author(s):  
D. Caillard ◽  
J.L. Martin
Keyword(s):  
Tensile Axis ◽  
Cell Structure ◽  
Image Intensifier ◽  
Foil Thickness ◽  
Average Cell Size ◽  
Average Cell ◽  
Voltage Electron ◽  
Steady Stage ◽  
Stationary Creep

The behaviour of the dislocation substructure during the steady stage regime of creep, as well as its contribution to the creep rate, are poorly known. In particular, the stability of the subboundaries has been questioned recently, on the basis of experimental observations |1||2| and theoretical estimates |1||3|. In situ deformation experiments in the high voltage electron microscope are well adapted to the direct observation of this behaviour. We report here recent results on dislocation and subboundary properties during stationary creep of an aluminium polycristal at 200°C.During a macroscopic creep test at 200°C, a cell substructure is developed with an average cell size of a few microns. Microsamples are cut out of these specimens |4| with the same tensile axis, and then further deformed in the microscope at the same temperature and stain rate. At 1 MeV, one or a few cells can be observed in the foil thickness |5|. Low electron fluxes and an image intensifier were used to reduce radiation damage effects.

Theory and Errors in Stereo Electron Microscopy

1968 ◽  
Vol 26 ◽  
pp. 336-337
Author(s):  
J. M. Pankratz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Plane Wave ◽  
Focal Length ◽  
Foil Thickness ◽  
Points Of Interest ◽  
Transmission Electron ◽  
Vertical Spacing ◽  
Illuminating System

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).

An example of spectrum imaging used for comparison of EELS quantitative analysis techniques on Al-Li

1991 ◽  
Vol 49 ◽  
pp. 726-727
Author(s):  
John A. Hunt
Keyword(s):  
Quantitative Analysis ◽  
Large Data ◽  
Difference Spectrum ◽  
Large Data Sets ◽  
Foil Thickness ◽  
Data Sets ◽  
Analysis Techniques ◽  
Spectrum Imaging ◽  
Normal Spectrum ◽  
Electron Energy Loss

Spectrum-imaging is a useful technique for comparing different processing methods on very large data sets which are identical for each method. This paper is concerned with comparing methods of electron energy-loss spectroscopy (EELS) quantitative analysis on the Al-Li system. The spectrum-image analyzed here was obtained from an Al-10at%Li foil aged to produce δ' precipitates that can span the foil thickness. Two 1024 channel EELS spectra offset in energy by 1 eV were recorded and stored at each pixel in the 80x80 spectrum-image (25 Mbytes). An energy range of 39-89eV (20 channels/eV) are represented. During processing the spectra are either subtracted to create an artifact corrected difference spectrum, or the energy offset is numerically removed and the spectra are added to create a normal spectrum. The spectrum-images are processed into 2D floating-point images using methods and software described in [1].

Interpretation of the Contrast of High-Resolution Electron Microscopy Images of Ni4Mo by Means of Simulated Image Maps

1990 ◽  
Vol 48 (1) ◽  
pp. 28-29
Author(s):  
A. Thust ◽  
K. Urban
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Antiphase Boundary ◽  
High Resolution Electron Microscopy ◽  
Foil Thickness ◽  
Order Structure ◽  
Simulated Image ◽  
Resolution Electron ◽  
Fcc Lattice ◽  
Direct Interpretation

The alloy of composition Ni4Mo develops, at temperatures below 860 °C, an ordered Dla-structure which is based on the fcc-lattice. This alloy has been widely investigated with respect to its physical properties and its ordering behaviour. High resolution studies are rare and concentrated mainly on its short-range order structure. The aim of the present work was to develop a detailed understanding of image contrast and to apply the results to antiphase-boundary studies in ordered Ni4Mo by means of a JEOL 4000 EX electron microscope.In high-resolution electron microscopy, depending on defocus and foil thickness, a large variety of different images is obtained. Only a few of these allow a direct interpretation concerning the location and the type of the atoms. By computing a through-focus/through-thickness map (TFTT map) before starting experimental work it is possible to determine the proper conditions at which images can be obtained which are closely related to the projected potential.

Soft x-ray images of the laser entrance hole of ignition hohlraums

2012 ◽  
Vol 83 (10) ◽  
pp. 10E525 ◽  
Author(s):  
M. B. Schneider ◽  
N. B. Meezan ◽  
S. S. Alvarez ◽  
J. Alameda ◽  
S. Baker ◽  
...  
Keyword(s):  
X Ray ◽  
Entrance Hole

Evaluation of Blister Behavior for U10Mo Mini Fuel Plates With Cold Rolled Foils

2012 ◽  
Author(s):  
Hakan Ozaltun ◽  
Samuel J. Miller
Keyword(s):  
Cold Rolling ◽  
Thermal Cycling ◽  
Cold Work ◽  
Rolling Process ◽  
Foil Thickness ◽  
Rolled Plate ◽  
Stress Profile ◽  
Wide Range ◽  
Threshold Temperatures ◽  
Cold Rolled

This article aims to provide possible mechanical causes for the lowered blister temperatures of RERTR-12 and AFIP-4 fuel plates. Recent experimental investigations to determine the blister threshold temperatures have indicated lower thresholds for similar plates with comparable burn-up histories. Measured blister temperatures of roughly 100 °C lower compared to the previously tested plates may not be satisfactory for some plates. The primary differences between recent experiments and previous tests are: (1) An aggressive cold work process involving large thickness reduction ratios without normalization or full annealing (2) Subjecting the plates to a thermal cycling process prior to irradiation, and finally (3) A primarily frontal neutron flux as opposed to a transverse flux profile. It is believed that the stress field has implications to blister behavior. To investigate this claim, the stress-strain states for the fabrication procedure were evaluated. First, the residual stress profile caused by the cold rolling process was calculated. Modeling of the cold rolling process has shown confirmation of residual stresses of considerable magnitude and the existence of stress gradients with respect to foil thickness prior to the HIP process. Once calculated, these stress profiles were used as an initial condition for the fabrication process. Due to the variation in stress fields depending on location at which a foil is cut from the cold rolled plate, three representative regions were selected and implemented in the HIP simulation. Variation in stresses, depending on location of the cold rolled plate as well and variation in the through-thickness, results in a wide range of mechanical stress states. This suggests that inhomogeneous irradiation and thermal cycling behavior will result from the use of cold rolled foils. Additionally, these results suggest that there will be fundamental differences in fuel plate behavior observed between plates fabricated with cold rolled foils versus hot rolled and fully annealed foils.

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