Thermal conductivity of irradiated porous silicon down to the oxide limit investigated by Raman thermometry and scanning thermal microscopy
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2007 ◽
Vol 40
(21)
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pp. 6677-6683
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1999 ◽
Vol 245
(1-3)
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pp. 203-209
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2014 ◽
Vol 25
(4)
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pp. 044022
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Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy
2013 ◽
Vol 44
(11)
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pp. 1029-1034
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