Low-energy electron inelastic mean free path for monolayer graphene

2020 ◽  
Vol 117 (3) ◽  
pp. 033103 ◽  
Author(s):  
Hieu T. Nguyen-Truong ◽  
Bo Da ◽  
Lihao Yang ◽  
Zejun Ding ◽  
Hideki Yoshikawa ◽  
...  
Keyword(s):  
Free Path ◽  
Mean Free Path ◽  
Low Energy ◽  
Energy Electron ◽  
Monolayer Graphene ◽  
Low Energy Electron ◽  
Inelastic Mean Free Path

scholarly journals Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

2020 ◽  
Vol 13 (4) ◽  
Author(s):  
Bo Da ◽  
Yang Sun ◽  
Zhufeng Hou ◽  
Jiangwei Liu ◽  
Nguyen Thanh Cuong ◽  
...  
Keyword(s):  
Free Path ◽  
Mean Free Path ◽  
Low Energy ◽  
Energy Electron ◽  
Monolayer Graphene ◽  
Low Energy Electron ◽  
Inelastic Mean Free Path

Low-energy electron inelastic mean free path and elastic mean free path of graphene

2021 ◽  
Vol 118 (5) ◽  
pp. 053104
Author(s):  
L. H. Yang ◽  
B. Da ◽  
H. Yoshikawa ◽  
S. Tanuma ◽  
J. Hu ◽  
...  
Keyword(s):  
Free Path ◽  
Mean Free Path ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
Inelastic Mean Free Path

scholarly journals Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

Nanomaterials ◽  
2021 ◽  
Vol 11 (9) ◽  
pp. 2435
Author(s):  
Ivo Konvalina ◽  
Benjamin Daniel ◽  
Martin Zouhar ◽  
Aleš Paták ◽  
Ilona Müllerová ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Free Path ◽  
Electron Scattering ◽  
Time Of Flight ◽  
Mean Free Path ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
Inelastic Mean Free Path ◽  
2D Crystals

The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering is the inelastic mean free path (IMFP) of electrons both in bulk materials and in thin films, including 2D crystals. The amount of IMFP data available is still not sufficient, especially for very slow electrons and for 2D crystals. This situation motivated the present study, which summarizes pilot experiments for graphene on a new device intended to acquire electron energy-loss spectra (EELS) for low landing energies. Thanks to its unique properties, such as electrical conductivity and transparency, graphene is an ideal candidate for study at very low energies in the transmission mode of an electron microscope. The EELS are acquired by means of the very low-energy electron microspectroscopy of 2D crystals, using a dedicated ultra-high vacuum scanning low-energy electron microscope equipped with a time-of-flight (ToF) velocity analyzer. In order to verify our pilot results, we also simulate the EELS by means of density functional theory (DFT) and the many-body perturbation theory. Additional DFT calculations, providing both the total density of states and the band structure, illustrate the graphene loss features. We utilize the experimental EELS data to derive IMFP values using the so-called log-ratio method.

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