scholarly journals Tilted fluctuation electron microscopy

2020 ◽  
Vol 117 (9) ◽  
pp. 091903
Author(s):  
Ellis Kennedy ◽  
Neal Reynolds ◽  
Luis Rangel DaCosta ◽  
Frances Hellman ◽  
Colin Ophus ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Fluctuation Electron Microscopy

scholarly journals Reducing Decoherence in Fluctuation Electron Microscopy

2021 ◽  
Vol 27 (S1) ◽  
pp. 1776-1777
Author(s):  
Armin Zjajo ◽  
Itai Matzkevich ◽  
Hongchu Du ◽  
Rafal Dunin-Borkowski ◽  
Aram Rezikyan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Fluctuation Electron Microscopy

Examination of a Polycrystalline Thin-Film Model to Explore the Relation between Probe Size and Structural Correlation Length in Fluctuation Electron Microscopy

2012 ◽  
Vol 18 (1) ◽  
pp. 241-253 ◽  
Author(s):  
M.M.J. Treacy ◽  
J.M. Gibson
Keyword(s):  
Electron Microscopy ◽  
Random Network ◽  
Voronoi Tessellation ◽  
Coherent Scattering ◽  
Specimen Thickness ◽  
Probe Size ◽  
Thin Film Model ◽  
Mean Grain Size ◽  
Fluctuation Electron Microscopy ◽  
Thin Polycrystalline

AbstractWe examine simulated electron microdiffraction patterns from models of thin polycrystalline silicon. The models are made by a Voronoi tessellation of random points in a box. The Voronoi domains are randomly selected to contain either a randomly-oriented cubic crystalline grain or a region of continuous random network material. The microdiffraction simulations from coherent probes of different widths are computed at the ideal kinematical limit, ignoring inelastic and multiple scattering. By examining the normalized intensity variance that is obtained in fluctuation electron microscopy experiments, we confirm that intensity fluctuations increase monotonically with the percentage of crystalline grains in the material. However, anomalously high variance is observed for models that have 100% crystalline grains with no imperfections. We confirm that the reduced normalized variance, V(k,R) − 1, that is associated with four-body correlations at scattering vector k, varies inversely with specimen thickness. Further, for probe sizes R larger than the mean grain size, we confirm that the reduced normalized variance obeys the predicted form given by Gibson et al. [Ultramicroscopy, 83, 169–178 (2000)] for the kinematical coherent scattering limit.

Hydrogen-Induced Reduction in Medium Range Order of a-Si Thin Films Observed using Fluctuation Electron Microscopy

2004 ◽  
Vol 10 (S02) ◽  
pp. 802-803
Author(s):  
Lakshmi Narayana Nittala ◽  
Sreenivas Jayaraman ◽  
Brent A Sperling ◽  
John R Abelson
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Range Order ◽  
Medium Range Order ◽  
Medium Range ◽  
Fluctuation Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

scholarly journals Simulation of Decoherence in Fluctuation Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 1592-1593
Author(s):  
A. Rezikyan ◽  
Z. Jibben ◽  
B. Rock ◽  
G. Zhao ◽  
M. Treacy
Keyword(s):  
Electron Microscopy ◽  
Fluctuation Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

scholarly journals Characterizing Magnetic Anisotropy in Amorphous Metal Films Using Tilted Fluctuation Electron Microscopy

2018 ◽  
Vol 24 (S1) ◽  
pp. 204-205
Author(s):  
Ellis Kennedy ◽  
Alejandro Ceballos ◽  
Frances Hellman ◽  
Colin Ophus ◽  
Mary Scott
Keyword(s):  
Electron Microscopy ◽  
Magnetic Anisotropy ◽  
Metal Films ◽  
Amorphous Metal ◽  
Fluctuation Electron Microscopy

scholarly journals Fluctuation Electron Microscopy of Shungite, a Disordered Natural Carbonaceous Material

2006 ◽  
Vol 12 (S02) ◽  
pp. 588-589
Author(s):  
M Treacy ◽  
A Rougee ◽  
P Buseck
Keyword(s):  
Electron Microscopy ◽  
Carbonaceous Material ◽  
Fluctuation Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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