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2020 ◽  
Vol 127 (21) ◽  
pp. 215707 ◽  
Author(s):  
Yuxuan Zhang ◽  
Zhaoying Chen ◽  
Wenbo Li ◽  
Hyunsoo Lee ◽  
Md Rezaul Karim ◽  
...  
Keyword(s):  
Impurity Incorporation ◽  
Power Devices ◽  
Fe Impurity

Mechanism of fe impurity incorporation into semi-insulating gaas crystals

1983 ◽  
Vol 12 (3) ◽  
pp. 563-573
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T. Udagawa ◽  
A. Tanaka ◽  
T. Nakanisi
Keyword(s):  
Impurity Incorporation ◽  
Fe Impurity

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Heiji Watanabe
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High Voltage ◽  
Defect Engineering ◽  
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Analysis of power devices breakdown behaviour by ion beam and electron beam induced charge microscopy

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A. Pugatschow ◽  
C. Geissler ◽  
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Keyword(s):  
Electron Beam ◽  
Ion Beam ◽  
Power Devices ◽  
Induced Charge
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