Electron‐spin‐resonance study of defects in plasma‐enhanced chemical vapor deposited silicon nitride
1989 ◽
Vol 39
(1-4)
◽
pp. 412-419
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1971 ◽
Vol 93
(25)
◽
pp. 6888-6890
◽
1987 ◽
Vol 36
(3)
◽
pp. 267-278
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