Electron‐beam‐pumped two‐dimensional semiconductor laser array with tilted mirror resonator

1988 ◽  
Vol 52 (16) ◽  
pp. 1303-1305
Author(s):  
F. Tong ◽  
R. M. Osgood ◽  
A. Sanchez ◽  
V. Daneu
1994 ◽  
Author(s):  
Steve Sanders ◽  
Robert G. Waarts ◽  
Derek W. Nam ◽  
David F. Welch ◽  
John C. Ehlert ◽  
...  

1989 ◽  
Vol 55 (4) ◽  
pp. 331-333 ◽  
Author(s):  
J. Buus ◽  
P. J. Williams ◽  
I. Goodridge ◽  
D. J. Robbins ◽  
J. Urquhart ◽  
...  

1994 ◽  
Vol 64 (12) ◽  
pp. 1478-1480 ◽  
Author(s):  
Steve Sanders ◽  
Robert Waarts ◽  
Derek Nam ◽  
David Welch ◽  
Don Scifres ◽  
...  

Author(s):  
S. Sanders ◽  
R. Waarts ◽  
D. Nam ◽  
D. Welch ◽  
J.C. Ehlert ◽  
...  

2020 ◽  
Vol 41 (9) ◽  
pp. 1158-1164
Author(s):  
Bo LI ◽  
◽  
Zhen-fu WANG ◽  
Bo-cang QIU ◽  
Guo-wen YANG ◽  
...  

2007 ◽  
Author(s):  
T. Kurobe ◽  
T. Kimoto ◽  
K. Muranushi ◽  
T. Mukaihara ◽  
M. Ariga ◽  
...  

1974 ◽  
Vol 4 (2) ◽  
pp. 242-243
Author(s):  
G S Kotovshchikov ◽  
V P Kuklev ◽  
N P Lantsov ◽  
G A Meerovich ◽  
A G Negodov ◽  
...  

2020 ◽  
Vol 2020 (12) ◽  
Author(s):  
V.Y. Rodyakin ◽  
◽  
V.M. Pikunov ◽  
V.N. Aksenov ◽  
◽  
...  

We present the results of a comparative theoretical analysis of the electron beam bunching in a single-stage klystron amplifier using analytical models, a one-dimensional disk program, and a two-dimensional program. Data on the influence of various one-dimensional and two-dimensional nonlinear effects on the efficiency of electron beam bunching at different values of the space charge parameter and the modulation amplitude are presented. The limits of applicability of analytical and one-dimensional numerical models for electron beam bunching analysis in high-power klystron amplifiers are found.


2016 ◽  
Vol 11 (1) ◽  
pp. 88-93
Author(s):  
Dmitriy Utkin ◽  
Aleksandr Shklyaev ◽  
Fedor Dultsev ◽  
Aleksandr Latyshev

Specific aspects of finely focused electron beam interaction with the PMMA-950K resist for the fabrication of closely spaced holes having inhomogeneous spatial distributions are studied. The technological parameters for the creation of two-dimensional photonic crystals with microcavities (missing holes) arrays, which allow obtaining the lateral sizes of the structure within the accuracy better than 2 %, in silicon using electron-beam lithography are determined. Such holes fabrication accuracy is thought to be sufficient to study the interference effects of cavity array radiation in twodimensional photonic crystals.


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