Low‐frequency noise measurements onn‐InGaAs/p‐InP junction field‐effect transistor structures

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pp. 111-113 ◽  
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1996 ◽  
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pp. 3138-3140 ◽  
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S.‐L. Rumyantsev ◽  
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W. C. B. Peatman ◽  
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Jong In Kim ◽  
Yoonki Hong ◽  
Jeongkyun Roh ◽  
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Vol 34 (2) ◽  
pp. 168-173
Author(s):  
V. L. Losev ◽  
A. V. Meshcheryakov ◽  
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