Optical time‐of‐flight measurement of carrier diffusion and trapping in an InGaAs/InP heterostructure
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2020 ◽
Vol 165
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pp. 105786
2014 ◽
Vol 4
(6)
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pp. 1518-1525
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2013 ◽
Vol 425
(12)
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pp. 122009
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