Electron beam stimulated nonthermal crystallization of CdS surface layers: Observations by real‐time atomic‐resolution electron microscopy

1986 ◽  
Vol 48 (25) ◽  
pp. 1751-1753 ◽  
Author(s):  
Daniel J. Ehrlich ◽  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Real Time ◽  
Atomic Resolution ◽  
Surface Layers ◽  
Resolution Electron

Electron-beam-stimulated processes at CdS surfaces observed by real-time atomic-resolution electron microscopy

1986 ◽  
Vol 1 (4) ◽  
pp. 560-563 ◽  
Author(s):  
David J. Smith ◽  
Daniel J. Ehrlich
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Nucleation And Growth ◽  
Atomic Resolution ◽  
Inelastic Electron ◽  
Electron Collisions ◽  
Resolution Electron ◽  
Electron Stimulated Desorption ◽  
Induced Changes ◽  
Cubic Cds

Electron-beam-induced changes in the structure of partially amorphous CdS surfaces have been observed directly by atomic-resolution electron microscopy. A sequence of atomic rearrangements leading to nucleation and growth of cubic CdS and hexagonal Cd has been documented. Inelastic electron collisions lead to crystallization of overlying amorphous CdS material whereas electron-stimulated desorption of S from the underlying CdS crystal results in precipitation of Cd crystallites at the crystalline/amorphous interface. From 100 to 500 keV the events are almost energy-independent.

Quantitative high-resolution electron microscopy (HREM) of defects in ordered polymers

1996 ◽  
Vol 54 ◽  
pp. 166-167
Author(s):  
Patricia M. Wilson ◽  
David C. Martin
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
High Resolution ◽  
Liquid Crystalline ◽  
High Resolution Electron Microscopy ◽  
Polymer Materials ◽  
Scattered Electron ◽  
Crystalline Polymers ◽  
Resolution Electron ◽  
Beam Damage

Efforts in our laboratory and elsewhere have established the utility of low dose high resolution electron microscopy (HREM) for imaging the microstructure of crystalline and liquid crystalline polymers. In a number of polymer systems, direct imaging of the lattice spacings by HREM has provided information about the size, shape, and relative orientation of ordered domains in these materials. However, because of the extent of disorder typical in many polymer microstructures, and because of the sensitivity of most polymer materials to electron beam damage, there have been few studies where the contrast observed in HREM images has been analyzed in a quantitative fashion.Here, we discuss two instances where quantitative information about HREM images has been used to provide new insight about the organization of crystalline polymers in the solid-state. In the first, we study the distortion of the polymer lattice planes near the core of an edge dislocation and compare these results to theories of dislocations in anisotropic and liquid crystalline solids. In the second, we investigate the variations in HREM contrast near the edge of wedge-shaped samples. The polymer used in this study was the diacetylene DCHD, which is stable to electron beam damage (Jc = 20 C/cm2) and highly crystalline. The instrument used in this work was a JEOL 4000 EX HRTEM with a beam blanidng device. More recently, the 4000 EX has been installed with instrumentation for dynamically recording scattered electron beam currents.

scholarly journals Atomic-resolution electron microscopy of nanoscale local structure in lead-based relaxor ferroelectrics

2020 ◽  
Vol 20 (1) ◽  
pp. 62-67 ◽  
Author(s):  
Abinash Kumar ◽  
Jonathon N. Baker ◽  
Preston C. Bowes ◽  
Matthew J. Cabral ◽  
Shujun Zhang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Local Structure ◽  
Relaxor Ferroelectrics ◽  
Atomic Resolution ◽  
Resolution Electron

Atomic resolution electron microscopy of NiO grain boudaries

1987 ◽  
Vol 22 (1-4) ◽  
pp. 57-70 ◽  
Author(s):  
K.L. Merkle ◽  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Atomic Resolution ◽  
Resolution Electron

scholarly journals StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images

2016 ◽  
Vol 171 ◽  
pp. 104-116 ◽  
Author(s):  
A. De Backer ◽  
K.H.W. van den Bos ◽  
W. Van den Broek ◽  
J. Sijbers ◽  
S. Van Aert
Keyword(s):  
Electron Microscopy ◽  
Atomic Resolution ◽  
Efficient Approach ◽  
Model Based ◽  
Resolution Electron ◽  
Microscopy Images
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