X‐ray photoemission spectroscopy study of surface oxidation of Nb/Al overlayer structures

J. Kwo; G. K. Wertheim; M. Gurvitch; D. N. E. Buchanan

doi:10.1063/1.93224

X‐ray photoemission spectroscopy study of surface oxidation of Nb/Al overlayer structures

Applied Physics Letters ◽

10.1063/1.93224 ◽

1982 ◽

Vol 40 (8) ◽

pp. 675-677 ◽

Cited By ~ 43

Author(s):

J. Kwo ◽

G. K. Wertheim ◽

M. Gurvitch ◽

D. N. E. Buchanan

Keyword(s):

Surface Oxidation ◽

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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High resolution synchrotron radiation-based x-ray photoemission spectroscopy study of the Si-rich β-SiC(100) 3×2 surface oxidation

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1589515 ◽

2003 ◽

Vol 21 (4) ◽

pp. 1876 ◽

Cited By ~ 5

Author(s):

D. Dunham ◽

S. Mehlberg ◽

S. Chamberlin ◽

P. Soukiassian ◽

J. D. Denlinger ◽

...

Keyword(s):

High Resolution ◽

Synchrotron Radiation ◽

Surface Oxidation ◽

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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Self-Assembled Carbon Nanotubes on Gold: Polarization-Modulated Infrared Reflection−Absorption Spectroscopy, High-Resolution X-ray Photoemission Spectroscopy, and Near-Edge X-ray Absorption Fine Structure Spectroscopy Study

Langmuir ◽

10.1021/la7030768 ◽

2008 ◽

Vol 24 (7) ◽

pp. 3235-3243 ◽

Cited By ~ 19

Author(s):

Natalia Kocharova ◽

Jarkko Leiro ◽

Jukka Lukkari ◽

Markku Heinonen ◽

Tomáš Skála ◽

...

Keyword(s):

Carbon Nanotubes ◽

Fine Structure ◽

High Resolution ◽

Absorption Spectroscopy ◽

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Infrared Reflection Absorption Spectroscopy ◽

Infrared Reflection ◽

X Ray Absorption

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X-ray photoemission spectroscopy study of zirconium hydride

Physical Review B ◽

10.1103/physrevb.19.2856 ◽

1979 ◽

Vol 19 (6) ◽

pp. 2856-2863 ◽

Cited By ~ 89

Author(s):

B. W. Veal ◽

D. J. Lam ◽

D. G. Westlake

Keyword(s):

Zirconium Hydride ◽

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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X-ray-photoemission-spectroscopy and bremsstrahlung-isochromat-spectroscopy study of the (Y,U)B4system

Physical Review B ◽

10.1103/physrevb.34.3737 ◽

1986 ◽

Vol 34 (6) ◽

pp. 3737-3740 ◽

Cited By ~ 19

Author(s):

D. D. Sarma ◽

S. Krummacher ◽

A. Wallash ◽

J. E. Crow

Keyword(s):

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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Electronic Structure of Sr2AlNbO6: Dielectric and X-ray Photoemission Spectroscopy Study

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.061504 ◽

2010 ◽

Vol 49 (6) ◽

pp. 061504 ◽

Cited By ~ 16

Author(s):

Alo Dutta ◽

Tripurari Prasad Sinha ◽

Santiranjan Shannigrahi

Keyword(s):

Electronic Structure ◽

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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Electronic structure ofNaxCu1−xIn5S8compounds: X-ray photoemission spectroscopy study and band structure calculations

Physical Review B ◽

10.1103/physrevb.78.235201 ◽

2008 ◽

Vol 78 (23) ◽

Cited By ~ 6

Author(s):

Catherine Guillot-Deudon ◽

Sylvie Harel ◽

Arezki Mokrani ◽

Alain Lafond ◽

Nicolas Barreau ◽

...

Keyword(s):

Electronic Structure ◽

Band Structure ◽

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Band Structure Calculations ◽

Structure Calculations

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7452. Heterogeneous Si3N4 growth during SiNx film deposition and thermal nitridation of Si(100): an X-ray photoemission spectroscopy study

Vacuum ◽

10.1016/0042-207x(91)91520-x ◽

1991 ◽

Vol 42 (10-11) ◽

pp. 668

Keyword(s):

Film Deposition ◽

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Thermal Nitridation ◽

Sinx Film

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X-ray Photoemission Spectroscopy Study of GaAs(111)B Substrate Nitridation using an RF-Radical Source

Japanese Journal of Applied Physics ◽

10.7567/jjap.51.048004 ◽

2012 ◽

Vol 51 (4R) ◽

pp. 048004 ◽

Cited By ~ 1

Author(s):

Shigeya Naritsuka ◽

Midori Mori ◽

Yoshitaka Takeuchi ◽

Takahiro Maruyama

Keyword(s):

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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Heterogeneous Si3N4 growth during SiNx film deposition and thermal nitridation of Si(100): An X-ray photoemission spectroscopy study

Thin Solid Films ◽

10.1016/0040-6090(90)90113-r ◽

1990 ◽

Vol 187 (1) ◽

pp. 101-109 ◽

Cited By ~ 11

Author(s):

J.L. Bischoff ◽

F. Lutz ◽

L. Kubler ◽

D. Bolmont

Keyword(s):

Film Deposition ◽

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Thermal Nitridation ◽

Sinx Film

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Corrigendum to “High-resolution X-ray photoemission spectroscopy study of AlN nano-columns grown by nitridation of Al nano-squares on Si(111) substrates with ammonia” [Thin Solid Films 518(2010) 3632–3639]

Thin Solid Films ◽

10.1016/j.tsf.2010.05.075 ◽

2010 ◽

Vol 519 (4) ◽

pp. 1487

Author(s):

B. Qi ◽

B. Agnarsson ◽

M. Göthelid ◽

S. Ólafsson ◽

H.P. Gíslason

Keyword(s):

High Resolution ◽

Photoemission Spectroscopy ◽

Spectroscopy Study ◽

Thin Solid Films ◽

X Ray ◽

Solid Films

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