Determination of the three‐dimensional lattice mismatch in quaternary III‐V liquid phase epitaxial layers using simultaneous Bragg diffraction of x‐rays

1980 ◽  
Vol 37 (9) ◽  
pp. 819-821 ◽  
Author(s):  
Shih‐Lin Chang
Keyword(s):  
Liquid Phase ◽  
Lattice Mismatch ◽  
Three Dimensional ◽  
Bragg Diffraction ◽  
Epitaxial Layers ◽  
X Rays ◽  
Dimensional Lattice ◽  
Liquid Phase Epitaxial

Bragg and Fresnel Diffraction Imaging Using Highly Coherent X-Rays

1998 ◽  
Vol 4 (S2) ◽  
pp. 376-377
Author(s):  
P. Cloetens ◽  
J. Baruchel ◽  
J.P. Guigay ◽  
W. Ludwig ◽  
L. Mancini ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Optical Path Length ◽  
Fresnel Diffraction ◽  
Crystal Defects ◽  
Bragg Diffraction ◽  
X Rays ◽  
Transmitted Beam ◽  
X Ray ◽  
Diffraction Imaging ◽  
Phase Variations

X-ray imaging started over a century ago. For several decades its only form was absorption radiography, in which contrast is due to local variations in beam attenuation. About forty years ago, a new form of X-ray imagery, Bragg-diffraction imaging or X-ray topography, developed into practical use. It directly reveals crystal defects in the bulk of large single crystals, and paved the way to microelectronics by leading to the growth of large, practically perfect, crystals. The advent of third-generation synchrotron radiation sources of X-rays such as ESRF and APS is now making possible, through the coherence of the X-ray beams, a novel form of radiography, in which contrast arises from phase variations across the transmitted beam, associated with optical path length differences, through Fresnel diffraction. Phase radiography and its three-dimensional companion, X-ray phase tomography, are providing new information on the mechanics of composites as well as on biological materials.

scholarly journals Determination of crystallographic intensities from sparse data

IUCrJ ◽  
2015 ◽  
Vol 2 (1) ◽  
pp. 29-34 ◽  
Author(s):  
Kartik Ayyer ◽  
Hugh T. Philipp ◽  
Mark W. Tate ◽  
Jennifer L. Wierman ◽  
Veit Elser ◽  
...  
Keyword(s):  
Diffraction Data ◽  
Crystal Size ◽  
Three Dimensional ◽  
Sparse Data ◽  
Data Sets ◽  
X Rays ◽  
Diffraction Intensity ◽  
X Ray ◽  
Proof Of Principle

X-ray serial microcrystallography involves the collection and merging of frames of diffraction data from randomly oriented protein microcrystals. The number of diffracted X-rays in each frame is limited by radiation damage, and this number decreases with crystal size. The data in the frame are said to be sparse if too few X-rays are collected to determine the orientation of the microcrystal. It is commonly assumed that sparse crystal diffraction frames cannot be merged, thereby setting a lower limit to the size of microcrystals that may be merged with a given source fluence. TheEMCalgorithm [Loh & Elser (2009),Phys. Rev. E,80, 026705] has previously been applied to reconstruct structures from sparse noncrystalline data of objects with unknown orientations [Philippet al.(2012),Opt. Express,20, 13129–13137; Ayyeret al.(2014),Opt. Express,22, 2403–2413]. Here, it is shown that sparse data which cannot be oriented on a per-frame basis can be used effectively as crystallographic data. As a proof-of-principle, reconstruction of the three-dimensional diffraction intensity using sparse data frames from a 1.35 kDa molecule crystal is demonstrated. The results suggest that serial microcrystallography is, in principle, not limited by the fluence of the X-ray source, and collection of complete data sets should be feasible at, for instance, storage-ring X-ray sources.

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