New effect in Josephson mixing of a submillimeter laser signal and a microwave signal

1975 ◽  
Vol 27 (12) ◽  
pp. 702-704 ◽  
Author(s):  
J. O. Henningsen ◽  
P. E. Lindelof ◽  
B. S. Steingrimsson
Keyword(s):  
Microwave Signal ◽  
Submillimeter Laser ◽  
Laser Signal

Advanced T-LSIM System Detections using Amplified External Isolated Source-Sense Unit

2018 ◽  
Author(s):  
Zhi Jie Lau ◽  
Chris Philips
Keyword(s):  
Fault Isolation ◽  
Isolation Technique ◽  
Laser Signal ◽  
Signal Injection ◽  
Sense Unit ◽  
Types Of Faults

Abstract Thermal-Laser Signal Injection Microscopy (T-LSIM) is a widely used fault isolation technique. Although there are several T-LSIM systems on the market, each is limited in terms of the voltage and current it can produce. In this paper, the authors explain how they incorporated an Amplified External Isolated Source-Sense (AxISS) unit into their T-LSIM platform, increasing its current sourcing capability and voltage biasing range. They also provide examples highlighting the types of faults and failures that the modified system can detect.

Case Study in Fault Isolation of a Metal Short for Yield Enhancement

2010 ◽  
Author(s):  
Sarven Ipek ◽  
David Grosjean
Keyword(s):  
Failure Analysis ◽  
Failure Mechanism ◽  
Photon Emission ◽  
Fault Isolation ◽  
Yield Enhancement ◽  
Analysis Technique ◽  
Laser Signal ◽  
Signal Injection ◽  
Microscopy Techniques

Abstract The application of an individual failure analysis technique rarely provides the failure mechanism. More typically, the results of numerous techniques need to be combined and considered to locate and verify the correct failure mechanism. This paper describes a particular case in which different microscopy techniques (photon emission, laser signal injection, and current imaging) gave clues to the problem, which then needed to be combined with manual probing and a thorough understanding of the circuit to locate the defect. By combining probing of that circuit block with the mapping and emission results, the authors were able to understand the photon emission spots and the laser signal injection microscopy (LSIM) signatures to be effects of the defect. It also helped them narrow down the search for the defect so that LSIM on a small part of the circuit could lead to the actual defect.

Photonic‐assisted wideband phase noise measurement of microwave signal sources

2015 ◽  
Vol 51 (16) ◽  
pp. 1272-1274 ◽  
Author(s):  
Fangzheng Zhang ◽  
Dengjian Zhu ◽  
Shilong Pan
Keyword(s):  
Phase Noise ◽  
Microwave Signal ◽  
Noise Measurement ◽  
Signal Sources

Features of the reference laser signal in the space-borne Fourier Transform Spectrometer

2010 ◽  
Author(s):  
Huandong Wei ◽  
Jianwen Hua ◽  
Zuoxiao Dai ◽  
Ren Chen ◽  
Xiaojie Sun
Keyword(s):  
Fourier Transform ◽  
Fourier Transform Spectrometer ◽  
Laser Signal ◽  
Reference Laser

Photonic Microwave Signal Processing

2005 ◽  
Author(s):  
K.J. Williams ◽  
J.L. Dexter ◽  
R.D. Esman
Keyword(s):  
Signal Processing ◽  
Microwave Signal

Optical Generation of Stable Microwave Signal Using a Dual-Wavelength Brillouin Fiber Laser

2010 ◽  
Vol 22 (8) ◽  
pp. 568-570 ◽  
Author(s):  
Zhijing Wu ◽  
Qishun Shen ◽  
Li Zhan ◽  
Jinmei Liu ◽  
Wen Yuan ◽  
...  
Keyword(s):  
Fiber Laser ◽  
Microwave Signal ◽  
Dual Wavelength ◽  
Optical Generation
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