Induced focusing and defocusing of optical beams via a Raman−type nonlinearity

1975 ◽  
Vol 26 (4) ◽  
pp. 168-170 ◽  
Author(s):  
Adelbert Owyoung
2004 ◽  
Vol 233 (1-3) ◽  
pp. 1-6 ◽  
Author(s):  
Xiujuan Jiang ◽  
Qi Guo ◽  
Huagang Li ◽  
Wei Hu

2004 ◽  
Vol 53 (11) ◽  
pp. 3771
Author(s):  
Jiang Xiu-Juan ◽  
Li Hua-Gang ◽  
Guo Qi ◽  
Hu Wei

Author(s):  
Charles Zhang ◽  
Matt Thayer ◽  
Lowell Herlinger ◽  
Greg Dabney ◽  
Manuel Gonzalez

Abstract A number of backside analysis techniques rely on the successful use of optical beams in performing backside fault isolation. In this paper, the authors have investigated the influence of the 1340 nm and 1064 nm laser wavelength on advanced CMOS transistor performance.


2005 ◽  
Vol 247 (4-6) ◽  
pp. 437-445 ◽  
Author(s):  
Keqing Lu ◽  
Wei Zhao ◽  
Yanlong Yang ◽  
Jinping Li ◽  
Yanpeng Zhang ◽  
...  

2018 ◽  
Vol 98 (4) ◽  
Author(s):  
S. N. Khonina ◽  
A. V. Ustinov ◽  
S. A. Degtyarev

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