Effect of space-charge limited emission on measurements of plasma potential using emissive probes

2000 ◽  
Vol 7 (8) ◽  
pp. 3457-3463 ◽  
Author(s):  
M. Y. Ye ◽  
S. Takamura
2020 ◽  
Vol 15 (0) ◽  
pp. 1301082-1301082
Author(s):  
Shogo HATTORI ◽  
Hirohiko TANAKA ◽  
Shin KAJITA ◽  
Noriyasu OHNO

2017 ◽  
Vol 24 (1) ◽  
pp. 013506 ◽  
Author(s):  
Jordan Cavalier ◽  
Nicolas Lemoine ◽  
Guillaume Bousselin ◽  
Nicolas Plihon ◽  
Jordan Ledig

1966 ◽  
Vol 2 (7) ◽  
pp. 282
Author(s):  
A.M. Phahle ◽  
K.C. Kao ◽  
J.H. Calderwood

1995 ◽  
Vol 377 ◽  
Author(s):  
G. J. Adriaenssens ◽  
B. Yan ◽  
A. Eliat

ABSTRACTA full and detailed transient space-charge-limited current (T-SCLC) study of a-Si:H p-i-n diodes has been carried out in the time range from 108s to 10s. In the short-time regime, general features of T-SCLC such as the current cusp and the carrier extraction period were observed, and related transport parameters were deduced. Electron emission from deep states was studied by measuring the current transients well beyond the extraction time. The emission time is thermally activated at temperatures higher than 250K and levels off at lower temperatures. The high temperature behaviour places the upper edge of the deep states at 0.42–0.52eV below the conduction band edge, and the attempt-to-escape frequency in the range of 1011-1013Hz. An observed shift of emission time with light intensity is attributed to defect relaxation.


Author(s):  
Manoj Prasad ◽  
Filip Strubbe ◽  
Filip Beunis ◽  
Kristiaan Neyts

Correction for ‘Space charge limited release of charged inverse micelles in non-polar liquids’ by Manoj Prasad et al., Phys. Chem. Chem. Phys., 2016, 18, 19289–19298, DOI: 10.1039/C6CP03544B.


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