Characterization of single wall carbon nanotubes by scanning tunneling and scanning force microscopy

1999 ◽  
Author(s):  
W. Clauss ◽  
M. Freitag ◽  
D. J. Bergeron ◽  
A. T. Johnson
Keyword(s):  
Carbon Nanotubes ◽  
Scanning Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Scanning Tunneling ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Scanning Force

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

SYNTHESIS AND SPECTROSCOPIC CHARACTERIZATION OF SALMON DNA-WRAPPED SINGLE-WALL CARBON NANOTUBES

NANO ◽  
2007 ◽  
Vol 02 (05) ◽  
pp. 295-299 ◽  
Author(s):  
YUKI ASADA ◽  
HIROFUMI DOHI ◽  
SHOTA KUWAHARA ◽  
TOSHIKI SUGAI ◽  
RYO KITAURA ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Near Infrared ◽  
Spectroscopic Characterization ◽  
Single Wall Carbon Nanotubes ◽  
Photoluminescence Spectra ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Spectral Shifts

Single-wall carbon nanotubes (SWNTs) can be well-dispersed in water by wrapping with short segments of natural DNA from salmon sperm. We report here the isolated DNA-wrapped SWNT hybrids. Measurements were carried out using UV-vis-NIR, near-infrared photoluminescence (PL) spectrum and atomic force microscopy (AFM). A possible charge transport between SWNTs and salmon-DNA is discussed in terms of observed spectral shifts in the photoluminescence spectra.

Scanned tip measurement of deep vertical facets on a flat surface: Measuring roughness on gaas laser waveguide mirrors

1993 ◽  
Vol 51 ◽  
pp. 532-533
Author(s):  
Chang Shen ◽  
Phil Fraundorf ◽  
Robert W. Harrick
Keyword(s):  
Integrated Circuits ◽  
Flat Surface ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Optoelectronic Integrated Circuits ◽  
Laser Waveguide ◽  
Scanning Force ◽  
Gaas Laser

Monolithic integration of optoelectronic integrated circuits (OEIC) requires high quantity etched laser facets which prevent the developing of more-highly-integrated OEIC's. The causes of facet roughness are not well understood, and improvement of facet quality is hampered by the difficulty in measuring the surface roughness. There are several approaches to examining facet roughness qualitatively, such as scanning force microscopy (SFM), scanning tunneling microscopy (STM) and scanning electron microscopy (SEM). The challenge here is to allow more straightforward monitoring of deep vertical etched facets, without the need to cleave out test samples. In this presentation, we show air based STM and SFM images of vertical dry-etched laser facets, and discuss the image acquisition and roughness measurement processes. Our technique does not require precision cleaving. We use a traditional tip instead of the T shape tip used elsewhere to preventing “shower curtain” profiling of the sidewall. We tilt the sample about 30 to 50 degrees to avoid the curtain effect.

Log-log scale roughness spectroscopy of surfaces

1993 ◽  
Vol 51 ◽  
pp. 224-225
Author(s):  
P. Fraundorf ◽  
B. Armbruster
Keyword(s):  
Power Spectrum ◽  
Autocorrelation Function ◽  
Power Spectra ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Lateral Structure ◽  
Scale Roughness

Optical interferometry, confocal light microscopy, stereopair scanning electron microscopy, scanning tunneling microscopy, and scanning force microscopy, can produce topographic images of surfaces on size scales reaching from centimeters to Angstroms. Second moment (height variance) statistics of surface topography can be very helpful in quantifying “visually suggested” differences from one surface to the next. The two most common methods for displaying this information are the Fourier power spectrum and its direct space transform, the autocorrelation function or interferogram. Unfortunately, for a surface exhibiting lateral structure over several orders of magnitude in size, both the power spectrum and the autocorrelation function will find most of the information they contain pressed into the plot’s origin. This suggests that we plot power in units of LOG(frequency)≡-LOG(period), but rather than add this logarithmic constraint as another element of abstraction to the analysis of power spectra, we further recommend a shift in paradigm.

Formation Of Single-Wall Carbon Nanotubes Forrest Assemblies On Metal Surfaces

2002 ◽  
Vol 734 ◽  
Author(s):  
Debjit Chattopadhyay ◽  
Izabela Galeska ◽  
Fotios Papadimitrakopoulos
Keyword(s):  
Carbon Nanotubes ◽  
Surface Coverage ◽  
Iron Hydroxide ◽  
Growth Characteristics ◽  
Self Organization ◽  
Single Wall Carbon Nanotubes ◽  
Unique Challenge ◽  
Single Wall Carbon ◽  
Topological Characteristics

ABSTRACTLearning how to purify and manipulate single wall carbon nanotubes (SWNTs) presents a unique challenge in material science. The processing-related difficulties of these long nano-fibers stem from their high aspect ratio, rigidity and the profound hydrophobic attractions along their tubular walls. Shortening them into discrete segments, with lengths from tens to hundreds of nanometers, presents a viable methodology to alleviate the shape-induced intractability. In addition, the metal-assisted self-organization of these nanosized objects into nano-forest geometries with dense perpendicular surface grafting, demonstrates that such nanosized objects hold significant promise for the development of nanoscale devices. This paper will present an extensive characterization of the topological characteristics of these assemblies, along with their surface coverage, growth characteristics and height fluctuation on iron hydroxide substrates.

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