RBS/Simulated Annealing and FTIR characterization of BCN films deposited by dual cathode magnetron sputtering

1999 ◽  
Author(s):  
N. P. Barradas ◽  
C. Jeynes ◽  
Y. Kusano ◽  
J. E. Evetts ◽  
I. M. Hutchings
Keyword(s):  
Simulated Annealing ◽  
Magnetron Sputtering ◽  
Ftir Characterization

Characterization of Ti–Zr–V thin films deposited by DC and unipolar pulsed DC magnetron sputtering

Vacuum ◽  
2021 ◽  
Vol 188 ◽  
pp. 110200
Author(s):  
Sihui Wang ◽  
Wei Wei ◽  
Yonghao Gao ◽  
Haibin Pan ◽  
Yong Wang
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Dc Magnetron Sputtering ◽  
Pulsed Dc ◽  
Pulsed Dc Magnetron Sputtering

scholarly journals Epitaxial growth and characterization of Cu thin films deposited on Al2O3(0001) substrates by magnetron sputtering

2021 ◽  
pp. 130119
Author(s):  
Ik-Jae Lee ◽  
Hee Seob Kim ◽  
Young Duck Yun ◽  
Seen-Woong Kang ◽  
Hyo-Yun Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Epitaxial Growth

Growth and characterization of device quality ZnO on Si(111) and c-sapphire using a conventional rf magnetron sputtering

2006 ◽  
Vol 17 (2-4) ◽  
pp. 305-310 ◽  
Author(s):  
Byung-Teak Lee ◽  
Sang-Hun Jeong ◽  
Myong-Ho Kim ◽  
Min-Ho Kuk ◽  
Dong-Sik Bae ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Rf Magnetron Sputtering

Synthesis and characterization of Cu3N–WC nanocomposite films prepared by direct current magnetron sputtering

2010 ◽  
Vol 518 (18) ◽  
pp. 5227-5232 ◽  
Author(s):  
Shihong Zhang ◽  
Yinsheng He ◽  
Mingxi Li ◽  
Yizhu He ◽  
Sikchol Kwon ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Direct Current ◽  
Nanocomposite Films ◽  
Synthesis And Characterization ◽  
Direct Current Magnetron Sputtering

Versatile thin layer spectroelectrochemical cell employing specular reflectance

1987 ◽  
Vol 65 (5) ◽  
pp. 919-923 ◽  
Author(s):  
A. Scott Hinman ◽  
Brad J. Pavelich
Keyword(s):  
Thin Layer ◽  
Specular Reflection ◽  
Incident Light ◽  
Tetrabutylammonium Perchlorate ◽  
Specular Reflectance ◽  
Advantages And Disadvantages ◽  
Ftir Characterization ◽  
Sandwich Type

A versatile thin layer spectroelectrochemical cell employing specular reflection of the incident light beam from the electrode surface is described. Its application to in-situ uv–vis and FTIR characterization of the products of electrochemical reactions and to thin layer voltammetry and coulometry as well as conventional cyclic voltammetry is demonstrated for the oxidation of tetraphenylporphinatozinc in dichloroethane/tetrabutylammonium perchlorate solution. The advantages and disadvantages of this type of cell as compared to more conventional sandwich type optically transparent thin layer electrodes are discussed.

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