scholarly journals A high resolution electron beam profile monitor and its applications

1998 ◽  
Author(s):  
W. S. Graves ◽  
E. D. Johnson ◽  
S. Ulc
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Beam Profile ◽  
Beam Profile Monitor ◽  
Resolution Electron

Quantitative high-resolution electron microscopy (HREM) of defects in ordered polymers

1996 ◽  
Vol 54 ◽  
pp. 166-167
Author(s):  
Patricia M. Wilson ◽  
David C. Martin
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
High Resolution ◽  
Liquid Crystalline ◽  
High Resolution Electron Microscopy ◽  
Polymer Materials ◽  
Scattered Electron ◽  
Crystalline Polymers ◽  
Resolution Electron ◽  
Beam Damage

Efforts in our laboratory and elsewhere have established the utility of low dose high resolution electron microscopy (HREM) for imaging the microstructure of crystalline and liquid crystalline polymers. In a number of polymer systems, direct imaging of the lattice spacings by HREM has provided information about the size, shape, and relative orientation of ordered domains in these materials. However, because of the extent of disorder typical in many polymer microstructures, and because of the sensitivity of most polymer materials to electron beam damage, there have been few studies where the contrast observed in HREM images has been analyzed in a quantitative fashion.Here, we discuss two instances where quantitative information about HREM images has been used to provide new insight about the organization of crystalline polymers in the solid-state. In the first, we study the distortion of the polymer lattice planes near the core of an edge dislocation and compare these results to theories of dislocations in anisotropic and liquid crystalline solids. In the second, we investigate the variations in HREM contrast near the edge of wedge-shaped samples. The polymer used in this study was the diacetylene DCHD, which is stable to electron beam damage (Jc = 20 C/cm2) and highly crystalline. The instrument used in this work was a JEOL 4000 EX HRTEM with a beam blanidng device. More recently, the 4000 EX has been installed with instrumentation for dynamically recording scattered electron beam currents.

Development of x-ray beam profile monitor based on in-house grown crystal and application in electron beam imaging

2020 ◽  
Author(s):  
Mohit Tyagi ◽  
P. S. Sarkar ◽  
R. S. Sengar ◽  
Ashwani Kumar ◽  
Jagannath ◽  
...  
Keyword(s):  
Electron Beam ◽  
Grown Crystal ◽  
Beam Profile ◽  
X Ray ◽  
Beam Profile Monitor

Evaluation of poly(p-trimethylsilylstyrene and p-pentamethyldisilylstyrene sulfone)s as high-resolution electron-beam resists

1991 ◽  
Author(s):  
Antoni S. Gozdz ◽  
Hiroshi Ono ◽  
Seiki Ito ◽  
John A. Shelburne III ◽  
Minoru Matsuda
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Resolution Electron

scholarly journals Tests of a high resolution beam profile monitor

2002 ◽  
Author(s):  
J. Norem ◽  
J. Dawson ◽  
W. Haberichter ◽  
R. Lam ◽  
L. Reed ◽  
...  
Keyword(s):  
High Resolution ◽  
Beam Profile ◽  
Beam Profile Monitor

High resolution electron beam lithography on CaF2

1984 ◽  
Vol 44 (4) ◽  
pp. 468-469 ◽  
Author(s):  
P. M. Mankiewich ◽  
H. G. Craighead ◽  
T. R. Harrison ◽  
A. H. Dayem
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Electron Beam Lithography ◽  
Resolution Electron
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