scholarly journals Infrared spectroscopy for process control and fault detection of advanced semiconductor processes

Author(s):  
P. Rosenthal ◽  
W. Aarts ◽  
A. Bonanno ◽  
D. Boning ◽  
S. Charpenay ◽  
...  
2010 ◽  
Vol 10 (6) ◽  
pp. 537-543 ◽  
Author(s):  
Stefan Luck ◽  
Gabriele Büge ◽  
Holger Plettenberg ◽  
Martin Hoffmann

2001 ◽  
Vol 34 (27) ◽  
pp. 297-302
Author(s):  
Dongkwon Lee ◽  
Young-Hak Lee ◽  
Jin Hyun Park ◽  
Chonghun Han ◽  
In-Bewn Lee

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