X-ray bursts from 4U 1608-52 and the associated low frequency noise

1998 ◽  
Author(s):  
W. Yu ◽  
S. N. Zhang ◽  
B. A. Harmon ◽  
W. S. Paciesas ◽  
C. R. Robinson ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
X Ray

The Effect of Indium Surfactant on the Optoelectronic and Structural Properties of MBE Grown Gallium Nitride

2000 ◽  
Vol 618 ◽  
Author(s):  
C.F. Zhu ◽  
W.K. Fong ◽  
B.H. Leung ◽  
C.C. Cheng ◽  
C. Surya ◽  
...  
Keyword(s):  
Gallium Nitride ◽  
Power Spectra ◽  
Low Frequency ◽  
Rf Plasma ◽  
Frequency Noise ◽  
Noise Power ◽  
Low Frequency Noise ◽  
X Ray Diffraction ◽  
X Ray ◽  
The One

ABSTRACTGallium nitride films were grown by rf-plasma assisted molecular beam epitaxy. A small indium flux was used as surfactant during the growth. The optical and electrical properties of the films grown with and without In surfactant were characterized by investigating the photoluminescence (PL), high resolution x-ray diffraction (HRXRD) and low-frequency noise power spectra. The sample grown in the presence of In surfactant showed a suppressed yellow luminescence (YL) compared to the one grown without In surfactant. Significant reduction in the full width at half maximum of the GaN (0002) x-ray diffraction peak, indicating a better film quality, was obtained when In surfactant was used during growth. Atomic force microscopy studies show that the root mean squared surface roughness for films grown with and without the In surfactant are 5.86 and 6.99 nm respectively indicating significant improvement in surface morphology. This is attributed to the enhanced 2-dimensional growth by In surfactant. A smaller Hooge parameter was obtained from the low-frequency noise measurement for the sample grown with In surfactant indicating that application of In surfactant led to significant reduction in the trap density of the material.

scholarly journals Quasi-Periodic Oscillations in Low-Mass X-ray Binaries

1987 ◽  
Vol 125 ◽  
pp. 321-331
Author(s):  
M. van der Klis
Keyword(s):  
Neutron Star ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Periodic Oscillations ◽  
X Ray ◽  
Low Mass ◽  
X Ray Binaries

The properties of the rapid, persistent quasi-periodic oscillations (QPO) discovered with EXOSAT in the X-ray flux of at least 7 bright low-mass X-ray binaries are described. Particular attention is given to the various relations observed between QPO frequency and X-ray intensity, the link between QPO and the low-frequency noise in the X-ray intensity and the bimodal properties of in particular Sco X-1, GX 5-1 and Cyg X-2. The merits of the hypothesis that the QPO indicate the presence of a neutron star with a magnetosphere are considered.

The influence of X-ray radiation on the low-frequency noise of integrated circuits

2011 ◽  
Vol 40 (7) ◽  
pp. 533-537
Author(s):  
M. I. Gorlov ◽  
D. Yu. Smirnov ◽  
E. A. Zolotareva
Keyword(s):  
Integrated Circuits ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
X Ray

Estimating the Quality of Thermionic Cathodes for Microwave Vacuum Tubes Using the Low-Frequency Noise Parameters

Vestnik MEI ◽  
2018 ◽  
Vol 5 (5) ◽  
pp. 120-127
Author(s):  
Mikhail D. Vorobyev ◽  
◽  
Dmitriy N. Yudaev ◽  
Andrey Yu. Zorin ◽  
◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Parameters ◽  
Thermionic Cathodes ◽  
Vacuum Tubes

Simulation of Low Frequency Noise in a CCTWT

1999 ◽  
Author(s):  
Charles K. Birdsall ◽  
J. P. Varboncoeur ◽  
P. J. Christensen
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise
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