Concentration of atomic oxygen in low earth orbit and in the laboratory for use in high quality oxide thin film growth

1998 ◽  
Author(s):  
J. A. Schultz ◽  
K. Eipers-Smith ◽  
K. Waters ◽  
S. Schultz ◽  
M. Sterling ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Oxygen ◽  
Film Growth ◽  
Low Earth Orbit ◽  
Thin Film Growth ◽  
Oxide Thin Film ◽  
Earth Orbit ◽  
High Quality

Epitaxial thin film growth in low Earth orbit on the Wake Shield Facility

1995 ◽  
Author(s):  
Charles Horton ◽  
Alex Ignatiev ◽  
Mark Sterling ◽  
Abdelhak Bensaoula ◽  
Alex Freundlich ◽  
...  
Keyword(s):  
Thin Film ◽  
Film Growth ◽  
Low Earth Orbit ◽  
Thin Film Growth ◽  
Earth Orbit ◽  
Epitaxial Thin Film ◽  
Epitaxial Thin Film Growth

scholarly journals The Effect of Low Earth Orbit Atomic Oxygen Exposure on Phenylphosphine Oxide-Containing Polymers

2000 ◽  
Vol 12 (1) ◽  
pp. 43-52 ◽  
Author(s):  
John W Connell
Keyword(s):  
Thin Film ◽  
Atomic Oxygen ◽  
Low Earth Orbit ◽  
Space Environment ◽  
Earth Orbit ◽  
Cooperative Effort ◽  
Flight Experiment ◽  
Oxygen Exposure ◽  
Atomic Oxygen Exposure ◽  
Phenylphosphine Oxide

Thin films of phenylphosphine oxide-containing polymers were exposed to low Earth orbit aboard a space shuttle flight (STS-85) as part of flight experiment designated Evaluation of Space Environment and Effects on Materials (ESEM). This flight experiment was a cooperative effort between the NASA Langley Research Center (LaRC) and the National Space Development Agency of Japan (NASDA). The thin-film samples described herein were part of an atomic oxygen exposure (AOE) experiment and were exposed to primarily atomic oxygen (∼1×1019 atoms cm−2). The thin-film samples consisted of three phosphine oxide-containing polymers (arylene ether, benzimidazole and imide). Based on post-flight analyses using atomic force microscopy, x-ray photo-electron spectroscopy and weight loss data, it was found that the exposure of these materials to atomic oxygen (AO) produces a phosphorus oxide layer on the surface of the samples. Earlier work has shown that this layer provides a barrier towards further attack by AO. Consequently, these materials do not exhibit linear erosion rates which is in contrast with most organic polymers. Qualitatively, the results obtained from these analyses compare favourably with those obtained from samples exposed to AO and/or an oxygen plasma in ground-based exposure experiments. The results of the low Earth orbit AO exposure on these materials will be compared with those of ground-based exposure to AO.

One-dimensional analytical model for oxide thin film growth on Ti metal layers during laser heating in air

2001 ◽  
Vol 175-176 ◽  
pp. 709-714 ◽  
Author(s):  
J.L. Jiménez Pérez ◽  
P.H. Sakanaka ◽  
M.A. Algatti ◽  
J.G. Mendoza-Alvarez ◽  
A. Cruz Orea
Keyword(s):  
Thin Film ◽  
Analytical Model ◽  
Laser Heating ◽  
Film Growth ◽  
Thin Film Growth ◽  
Oxide Thin Film ◽  
One Dimensional ◽  
Metal Layers

Molecular Mechanisms of Aluminum Oxide Thin Film Growth on Polystyrene during Atomic Layer Deposition

2010 ◽  
Vol 16 (47) ◽  
pp. 13925-13929 ◽  
Author(s):  
Manjunath Puttaswamy ◽  
Kenneth Brian Haugshøj ◽  
Leif Højslet Christensen ◽  
Peter Kingshott
Keyword(s):  
Thin Film ◽  
Atomic Layer Deposition ◽  
Aluminum Oxide ◽  
Molecular Mechanisms ◽  
Film Growth ◽  
Atomic Layer ◽  
Thin Film Growth ◽  
Oxide Thin Film ◽  
Layer Deposition

scholarly journals High quality superconducting titanium nitride thin film growth using infrared pulsed laser deposition

2018 ◽  
Vol 31 (5) ◽  
pp. 055017 ◽  
Author(s):  
A Torgovkin ◽  
S Chaudhuri ◽  
A Ruhtinas ◽  
M Lahtinen ◽  
T Sajavaara ◽  
...  
Keyword(s):  
Thin Film ◽  
Titanium Nitride ◽  
Pulsed Laser Deposition ◽  
Film Growth ◽  
Pulsed Laser ◽  
Thin Film Growth ◽  
Laser Deposition ◽  
High Quality

scholarly journals Reaction of Tri-methylaluminum on Si (001) Surface for Initial Aluminum Oxide Thin-Film Growth

2010 ◽  
Vol 31 (12) ◽  
pp. 3579-3582 ◽  
Author(s):  
Dae-Hee Kim ◽  
Dae-Hyun Kim ◽  
Yong-Chan Jeong ◽  
Hwa-Il Seo ◽  
Yeong-Cheol Kim
Keyword(s):  
Thin Film ◽  
Aluminum Oxide ◽  
Film Growth ◽  
Thin Film Growth ◽  
Oxide Thin Film
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