Origin of high carrier concentration in amorphous wide-bandgap oxides: Role of disorder in defect formation and electron localization in In2O3−x
Keyword(s):
2015 ◽
Vol 38
◽
pp. 50-56
◽
2019 ◽
Vol 116
(44)
◽
pp. 21998-22003
◽
2013 ◽
Vol 2013
◽
pp. 1-4
◽
Keyword(s):
2007 ◽
Vol 4
(7)
◽
pp. 2215-2218
◽
2017 ◽
Vol 5
(46)
◽
pp. 12023-12030
◽