Enhanced photovoltaic effects in ferroelectric solid solution thin films with nanodomains

2020 ◽  
Vol 116 (13) ◽  
pp. 132901 ◽  
Author(s):  
Hiroki Matsuo ◽  
Yuji Noguchi ◽  
Masaru Miyayama ◽  
Takanori Kiguchi ◽  
Toyohiko J. Konno
Author(s):  
R. M. Anderson

Aluminum-copper-silicon thin films have been considered as an interconnection metallurgy for integrated circuit applications. Various schemes have been proposed to incorporate small percent-ages of silicon into films that typically contain two to five percent copper. We undertook a study of the total effect of silicon on the aluminum copper film as revealed by transmission electron microscopy, scanning electron microscopy, x-ray diffraction and ion microprobe techniques as a function of the various deposition methods.X-ray investigations noted a change in solid solution concentration as a function of Si content before and after heat-treatment. The amount of solid solution in the Al increased with heat-treatment for films with ≥2% silicon and decreased for films <2% silicon.


2017 ◽  
Vol 47 ◽  
pp. 71-78
Author(s):  
H. Mechri ◽  
Ahmed Haddad ◽  
M. Zergoug ◽  
Mohammed Azzaz

Commercial copper and iron powders were used as starting materials. These powders were mechanically alloyed to obtain Cu(100-x) Fex supersaturated mixture. The milling duration was chosen in such a way as to obtain a nanostructured mixture and to form a supersaturated solid solution of CuFe; the powder mixture was used to deposit CuFe on a glass substrate. The elaboration of our films has been carried out using thermal evaporation process (physical vapor deposition) under 1 × 10-6 mbar vacuum from an electrically heated tungsten boat, using the supersaturated solid solution Cu(100-x) Fex powder obtained by mechanical alloying. The films deposition has been done on glass substrates. In this study, we present the composition effect on the structural and magnetic proprieties of Cu(100-x) Fex powder and thin films. The chemical composition, structural and magnetic proprieties of milled powders and thin films were examined by SEM, TEM, XRD, XRF and VSM.


2007 ◽  
Vol 310 (2) ◽  
pp. 2105-2107 ◽  
Author(s):  
Hajime Hojo ◽  
Koji Fujita ◽  
Katsuhisa Tanaka ◽  
Kazuyuki Hirao

2001 ◽  
Vol 673 ◽  
Author(s):  
Seungmin Hyun ◽  
Oliver Kraft ◽  
Richard P. Vinci

ABSTRACTThe elastic moduli and flow stresses of as-deposited Pt and Pt-Ru solid solution thin films were investigated by the nanoindentation method. The influence of solid solution alloying was explored by depositing Pt-Ru solid solution thin films with various compositions onto Si substrates. The 200 nm films were prepared by DC magnetron cosputtering with a Ru composition range from 0 to 20wt%. As expected, the modulus and the flow stress both increased significantly with an increase in Ru. The experimental results compare favorably to predictions based on a simple dislocation motion model consisting of three strengthening terms: substrate constraint, grain size strengthening and solid solution strengthening.


2012 ◽  
Vol 538 ◽  
pp. 73-78 ◽  
Author(s):  
H. Le-Quoc ◽  
A. Lacoste ◽  
S. Béchu ◽  
A. Bès ◽  
D. Bourgault ◽  
...  
Keyword(s):  

2011 ◽  
Vol 58 (3(1)) ◽  
pp. 674-677 ◽  
Author(s):  
Jung Min Park ◽  
Takeshi Kanashima ◽  
Masanori Okuyama ◽  
Seiji Nakashima ◽  
Kyung Man Kim ◽  
...  

2001 ◽  
Vol 691 ◽  
Author(s):  
Ichiro Matsubara ◽  
Ryoji Funahashi ◽  
Masahiro Shikano ◽  
Kei Sasaki ◽  
Hiroyuki Enomoto

ABSTRACTWe have prepared (Ca1−x−yMxBiy)3Co4Oz (M = Mg, Sr, and Ba) thin films by a combinatorial approach using a solution process. In the systems of (Ca1−x−yMxBiy)3Co4Oz (M = Mg, Sr, and Ba), solid solution range was determined to be × < 0.8 (M = Sr, y = 0), x < 1.0 (M = Mg, y = 0), x = 0.0 (M = Ba, y = 0), and x < 0.4 (M = Bi, x = 0). No solid solution range was obtained for the substitution of Ba for Ca site. The in-plane compressive stress in the CoO2 sublattice is controllable by the cation substitution for Ca in the (Ca2CoO3) sublattice. With increasing in-plane stress, the magnitude of thermoelectric power and resistivity increased.


2005 ◽  
Vol 44 (9A) ◽  
pp. 6648-6653 ◽  
Author(s):  
Jin Young Kim ◽  
Dong-Wan Kim ◽  
Hyun Suk Jung ◽  
Kug Sun Hong

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