A maximum extreme-value distribution model for switching conductance of oxide-RRAM in memory applications
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2016 ◽
Vol 30
(4)
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pp. 369-379
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2013 ◽
Vol 27
(6)
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pp. 1525-1531
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2014 ◽
Vol 59
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pp. 386-392
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2019 ◽
Vol 75
(2)
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pp. I_917-I_922
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