scholarly journals Ultrafast sensing of photoconductivity decay using microwave resonators

2019 ◽  
Vol 126 (23) ◽  
pp. 235702 ◽  
Author(s):  
B. Gyüre-Garami ◽  
B. Blum ◽  
O. Sági ◽  
A. Bojtor ◽  
S. Kollarics ◽  
...  
Keyword(s):  
Microwave Resonators ◽  
Photoconductivity Decay

Measuring the Dielectric Parameters of Frozen Sand in Microwave Resonators

2004 ◽  
Vol 47 (4) ◽  
pp. 260-267 ◽  
Author(s):  
G. S. Bordonsky ◽  
A. O. Orlov ◽  
T. G. Filippova
Keyword(s):  
Dielectric Parameters ◽  
Microwave Resonators ◽  
Frozen Sand

scholarly journals Template Nanowires for Spintronics Applications: Nanomagnet Microwave Resonators Functioning in Zero Applied Magnetic Field

Nano Letters ◽  
2008 ◽  
Vol 8 (11) ◽  
pp. 3683-3687 ◽  
Author(s):  
A. Mourachkine ◽  
O. V. Yazyev ◽  
C. Ducati ◽  
J.-Ph. Ansermet
Keyword(s):  
Magnetic Field ◽  
Applied Magnetic Field ◽  
Microwave Resonators

scholarly journals A tunable coupler for superconducting microwave resonators using a nonlinear kinetic inductance transmission line

2016 ◽  
Vol 108 (22) ◽  
pp. 222604 ◽  
Author(s):  
C. Bockstiegel ◽  
Y. Wang ◽  
M. R. Vissers ◽  
L. F. Wei ◽  
S. Chaudhuri ◽  
...  
Keyword(s):  
Transmission Line ◽  
Kinetic Inductance ◽  
Microwave Resonators ◽  
Nonlinear Kinetic

Precise Measurements of Transient Excess Carrier Lifetimes in II-VI Films and Superlattices

1989 ◽  
Vol 161 ◽  
Author(s):  
W. O. Doggett ◽  
Michael W. Thelander ◽  
J. F. Schetzina
Keyword(s):  
Molecular Beam ◽  
Statistical Data ◽  
Laser Pulses ◽  
Statistical Data Analysis ◽  
Analysis Techniques ◽  
Excess Carrier ◽  
Carrier Lifetimes ◽  
System A ◽  
Transient Photoconductivity ◽  
Photoconductivity Decay

ABSTRACTA system has been developed for accurately measuring lifetimes for photo-induced excess current carriers in semiconductors using the transient photoconductivity decay method. The specifications of state-of-the-art equipment, considerations peculiar to the capture of fast transient pulses, and sophisticated statistical data analysis techniques are discussed. Experimental results are presented to demonstrate the capability of the system (a) to measure lifetimes in the 40-ns - 75-µs range for temperatures varying from 77K to 300K with 10% accuracy for single lifetime decays and 30% accuracy for individual effective lifetimes in a multi-component decay, and (b) to use a 300-ns lifetime photoconductor as a detector to measure nanosecond-time-scale structure of laser pulses. The predominant excess carrier lifetimes of HgCdTe samples grown at NCSU by photoassisted molecular beam epitaxy (PAMBE) ranged from 46 ns at 300K to 341 ns at 77K. CdTe samples and CdMnTe-CdTe superlattices exhibited a multi-component decay with the two longest components having effective lifetimes of 26 µs and 4 µs for CdTe and 75 µs and 10 µs for CdMnTe-CdTe. These values were relatively insensitive to temperature variation.

Mechanisms Limiting the Performance of ${\rm MgB}_{2}$ Polycrystalline Thin Film Microwave Resonators

2011 ◽  
Vol 21 (3) ◽  
pp. 579-582 ◽  
Author(s):  
Gianluca Ghigo ◽  
Roberto Gerbaldo ◽  
Laura Gozzelino ◽  
Francesco Laviano ◽  
Bruno Minetti ◽  
...  
Keyword(s):  
Thin Film ◽  
Polycrystalline Thin Film ◽  
Microwave Resonators
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