scholarly journals Characterization of Sc/Mg multilayers with and without Co barriers layers for x-ray spectroscopy in the water window range

2019 ◽  
Vol 126 (19) ◽  
pp. 195301 ◽  
Author(s):  
Philippe Jonnard ◽  
Meiyi Wu ◽  
Karine Le Guen ◽  
Angelo Giglia ◽  
Konstantin Koshmak ◽  
...  
Keyword(s):  
X Ray ◽  
Water Window

scholarly journals Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors

Nukleonika ◽  
2016 ◽  
Vol 61 (2) ◽  
pp. 139-143 ◽  
Author(s):  
Alfio Torrisi ◽  
Przemysław Wachulak ◽  
Lorenzo Torrisi ◽  
Andrzej Bartnik ◽  
Łukasz Węgrzyński ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Pulsed Laser ◽  
Nitrogen Plasma ◽  
Plasma Emission ◽  
Nitrogen Gas ◽  
X Ray ◽  
Water Window ◽  
Target Source ◽  
Plasma Characterization

Abstract An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ= 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Silicon Carbide (SiC) detector was used to characterize the nitrogen plasma emission in terms of gas-puff target parameters. The measurements show applicability of SiC detectors for SXR plasma characterization.

scholarly journals Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurements

2016 ◽  
Vol 49 (6) ◽  
pp. 2161-2171 ◽  
Author(s):  
Anton Haase ◽  
Saša Bajt ◽  
Philipp Hönicke ◽  
Victor Soltwisch ◽  
Frank Scholze
Keyword(s):  
Analytical Techniques ◽  
Normal Incidence ◽  
Interface Roughness ◽  
Particle Swarm Optimizer ◽  
Individual Layer ◽  
Multilayer Systems ◽  
X Ray ◽  
Water Window ◽  
Fluorescence Measurements

Cr/Sc multilayer systems can be used as near-normal incidence mirrors for the water window spectral range. It is shown that a detailed characterization of these multilayer systems with 400 bilayers of Cr and Sc, each with individual layer thicknesses <1 nm, is attainable by the combination of several analytical techniques. EUV and X-ray reflectance measurements, resonant EUV reflectance across the ScLedge, and X-ray standing wave fluorescence measurements were used. The parameters of the multilayer model were determinedviaa particle-swarm optimizer and validated using a Markov chain Monte Carlo maximum-likelihood approach. For the determination of the interface roughness, diffuse scattering measurements were conducted.

scholarly journals Characterization and optimization of a laser generated plasma source of soft X rays

1988 ◽  
Vol 6 (2) ◽  
pp. 225-234 ◽  
Author(s):  
A. M. Rogoyski ◽  
P. Charalambous ◽  
C. P. Hills ◽  
A. G. Michette
Keyword(s):  
Angular Distribution ◽  
Plasma Source ◽  
Biological Imaging ◽  
X Rays ◽  
Specific Interest ◽  
X Ray ◽  
Preliminary Characterization ◽  
Water Window ◽  
Monochromatic Source

An investigation into the feasibility of using a laser-generated plasma source of soft X rays as a laboratory based instrument for biological imaging and microlithography is presented. A preliminary characterization of the source has been carried out with carbon, copper and aluminum targets with specific interest in generating a monochromatic source of soft X rays in the ‘water window’. Measurements of X-ray production with respect to angular distribution, effects of cratering and different focusing conditions are reported. Initial conclusions on the optimization of the source for use in biological imaging are drawn.

Experimental characterization of short-wavelength Ni-like soft-x-ray lasing toward the water window

1999 ◽  
Vol 16 (12) ◽  
pp. 2295 ◽  
Author(s):  
H. Daido ◽  
S. Sebban ◽  
N. Sakaya ◽  
Y. Tohyama ◽  
T. Norimatsu ◽  
...  
Keyword(s):  
Short Wavelength ◽  
Experimental Characterization ◽  
X Ray ◽  
Water Window

Preliminary synchrotron radiation characterization of first multilayer mirrors for the soft X-ray water window

2007 ◽  
Vol 62 (6-7) ◽  
pp. 586-592 ◽  
Author(s):  
Gianfelice Cinque ◽  
Antonio Grilli ◽  
Giannantonio Cibin ◽  
Agostino Raco ◽  
Alessandro Patelli ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Multilayer Mirrors ◽  
X Ray ◽  
Water Window

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

X-ray Gabor holography

1995 ◽  
Vol 53 ◽  
pp. 612-613
Author(s):  
Steve Lindaas ◽  
Chris Jacobsen ◽  
Alex Kalinovsky ◽  
Malcolm Howells
Keyword(s):  
Surface Relief ◽  
Biological Imaging ◽  
Specimen Preparation ◽  
X Rays ◽  
X Ray ◽  
Water Window ◽  
Biological Objects ◽  
Transmission Imaging ◽  
Atomic Force ◽  
Electron Microscopes

Soft x-ray microscopy offers an approach to transmission imaging of wet, micron-thick biological objects at a resolution superior to that of optical microscopes and with less specimen preparation/manipulation than electron microscopes. Gabor holography has unique characteristics which make it particularly well suited for certain investigations: it requires no prefocussing, it is compatible with flash x-ray sources, and it is able to use the whole footprint of multimode sources. Our method serves to refine this technique in anticipation of the development of suitable flash sources (such as x-ray lasers) and to develop cryo capabilities with which to reduce specimen damage. Our primary emphasis has been on biological imaging so we use x-rays in the water window (between the Oxygen-K and Carbon-K absorption edges) with which we record holograms in vacuum or in air.The hologram is recorded on a high resolution recording medium; our work employs the photoresist poly(methylmethacrylate) (PMMA). Following resist “development” (solvent etching), a surface relief pattern is produced which an atomic force microscope is aptly suited to image.

Plant Pathology Diagnosed by X-Ray Microanalysis

1987 ◽  
Vol 45 ◽  
pp. 974-975
Author(s):  
J. H. Resau ◽  
N. Howell ◽  
S. H. Chang
Keyword(s):  
Electron Microscopy ◽  
Plant Pathology ◽  
Biochemical Characterization ◽  
Nutrient Deficiency ◽  
Green Leaf ◽  
Parasitic Infestation ◽  
X Ray

Spinach grown in Texas developed “yellow spotting” on the peripheral portions of the leaves. The exact cause of the discoloration could not be determined as there was no evidence of viral or parasitic infestation of the plants and biochemical characterization of the plants did not indicate any significant differences between the yellow and green leaf portions of the spinach. The present study was undertaken using electron microscopy (EM) to determine if a micro-nutrient deficiency was the cause for the discoloration.Green leaf spinach was collected from the field and sent by express mail to the EM laboratory. The yellow and equivalent green portions of the leaves were isolated and dried in a Denton evaporator at 10-5 Torr for 24 hrs. The leaf specimens were then examined using a JEOL 100 CX analytical microscope. TEM specimens were prepared according to the methods of Trump et al.

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