scholarly journals Vacuum-compatible photon-counting hybrid pixel detector for wide-angle x-ray scattering, x-ray diffraction, and x-ray reflectometry in the tender x-ray range

2020 ◽  
Vol 91 (2) ◽  
pp. 023102
Author(s):  
D. Skroblin ◽  
A. Schavkan ◽  
M. Pflüger ◽  
N. Pilet ◽  
B. Lüthi ◽  
...  
Keyword(s):  
Photon Counting ◽  
Wide Angle ◽  
Pixel Detector ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Time-resolved isothermal crystallization of absorbable PGA-co-PLA copolymer by synchrotron small-angle X-ray scattering and wide-angle X-ray diffraction

Polymer ◽  
2001 ◽  
Vol 42 (21) ◽  
pp. 8965-8973 ◽  
Author(s):  
Zhi-Gang Wang ◽  
Xuehui Wang ◽  
Benjamin S. Hsiao ◽  
Saša Andjelić ◽  
Dennis Jamiolkowski ◽  
...  
Keyword(s):  
Small Angle ◽  
Isothermal Crystallization ◽  
Wide Angle ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Smectogenic liquid crystals and nanoparticles: an approach for potential application in photovoltaics

2015 ◽  
Vol 3 (33) ◽  
pp. 8566-8573 ◽  
Author(s):  
A. Meneses-Franco ◽  
A. E. Fierro-Armijo ◽  
P. Romero-Hasler ◽  
L. G. Salamanca-Riba ◽  
L. J. Martínez-Miranda ◽  
...  
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Potential Application ◽  
Planar Geometry ◽  
Wide Angle ◽  
X Ray Diffraction ◽  
Polarized Optical Microscopy ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

We synthesized monomeric liquid crystals, M6R8 and I6R8, and nanoparticles of TiO2, to form a nanocomposite, which was characterized by polarized optical microscopy (POM), DSC and structurally with both wide angle X-ray diffraction and by X-ray scattering using the planar geometry.

In-house simultaneous collection of small-angle X-ray scattering, wide-angle X-ray diffraction and Raman scattering data from polymeric materials

2014 ◽  
Vol 47 (3) ◽  
pp. 922-930 ◽  
Author(s):  
Raita Hirose ◽  
Taiyo Yoshioka ◽  
Hiroko Yamamoto ◽  
Kummetha Raghunatha Reddy ◽  
Daisuke Tahara ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Small Angle ◽  
Polymeric Materials ◽  
Scattering Data ◽  
Present System ◽  
Wide Angle ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

An in-house X-ray scattering system, which can simultaneously measure small-angle X-ray scattering (SAXS) and wide-angle X-ray diffraction (WAXD) data, as well Raman scattering data, has been developed to study the phase transitions of polymeric materials. To date, these types of measurements have been limited to synchrotron radiation. The present system is an in-house SAXS system combined with a WAXD detector and a Raman spectrometer. A rotating-anode X-ray generator and multilayer optic are employed to provide a high-flux X-ray beam. Two two-dimensional hybrid pixel detectors are utilized for the rapid-scan time-resolved SAXS and WAXD measurements. The Raman unit consists of a compact probe with a near-infrared excitation laser operating at a wavelength of 1064 nm. This long-wavelength laser produces less fluorescence than conventional excitation lasers with wavelengths of 532 or 785 nm. The performance of this system was tested by investigating the thermally induced ferroelectric phase transition of vinylidene fluoride–trifluoroethylene (VDF-TrFE) copolymers. It has been demonstrated that the combination of SAXS, WAXD and Raman techniques gives useful information for revealing the relationship between the structural change in the crystal lattice and the morphological change in the lamellar stacking mode in polymer samples of complicated hierarchical structure.

Education program for controversial defect of recent X-ray instrument termed as a simultaneous small angle X-ray scattering and wide angle X-ray diffraction measuring instrument

2018 ◽  
Vol 90 (6) ◽  
pp. 969-987
Author(s):  
Masaru Matsuo ◽  
Yuezhen Bin
Keyword(s):  
Small Angle ◽  
Diffraction Peak ◽  
Bragg Angle ◽  
Imaging Plate ◽  
Wide Angle ◽  
Measuring Instrument ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Abstract Simultaneous rotations of sample and X-ray detected counter are needed to evaluate orientation distribution of crystallites and amorphous chains oriented predominantly parallel to the film surface in addition to exact diffraction peak profiles obtained without the complicated intensity corrections. The rotation mode is known as “θ–2θ scanning” system (θ: film, 2θ: counter). The system has been mainly used in research and development institutes. However, such instruments are not produced at present. Recently, small angle X-ray scattering (SAXS) and wide angle X-ray diffraction (WAXD) intensities have been measured by using X-ray beam generated along one direction. The brand name of the instrument is “a simultaneous SAXS and WAXD measuring instrument”. The X-ray beam generated by the instrument has surely high luminance providing high degree resolution of peak profiles by diffraction and/or scattering. The sample stage and detector, however, are fixed, since the intensities for SAXS and WAXD are obtained by the digital display of the number of X-ray photons detected on the imaging plate. Such optical system contains controversial defect on evaluating orientation of crystal planes parallel to the surface of films prepared by T-die and inflation methods as well as the exact profile. The imaging plate cannot detect the diffraction intensity from the crystal planes existing in the angle range between incident beam and Bragg angle associated with the diffraction peak position of the individual crystal planes.

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