scholarly journals Polarization Stark spectroscopy for spatially resolved measurements of electric fields in the sheaths of ICRF antenna

2019 ◽  
Vol 90 (12) ◽  
pp. 123101
Author(s):  
A. Kostic ◽  
K. Crombé ◽  
R. Dux ◽  
M. Griener ◽  
R. Ochoukov ◽  
...  
Keyword(s):  
Electric Fields ◽  
Stark Spectroscopy ◽  
Spatially Resolved

scholarly journals Vibrational Stark Spectroscopy Directly Probes Electric Fields in Proteins

2013 ◽  
Vol 104 (2) ◽  
pp. 355a
Author(s):  
Steven Boxer ◽  
Sayan Bagchi ◽  
Stephen D. Fried ◽  
Nick Levinson ◽  
Miguel Saggu ◽  
...  
Keyword(s):  
Electric Fields ◽  
Stark Spectroscopy

Ultralow-Energy Excitations and Prospects for Spatially Resolved Spectroscopy

2004 ◽  
Vol 10 (1) ◽  
pp. 28-33 ◽  
Author(s):  
A. Howie
Keyword(s):  
Electric Fields ◽  
Electron Beams ◽  
Condensed Matter ◽  
Intermediate Energy ◽  
X Ray ◽  
Ultralow Energy ◽  
Spatially Resolved ◽  
Direct Excitation ◽  
Spatially Resolved Spectroscopy ◽  
Electron Energy Loss

The key contribution of electron microscopy methods to condensed matter spectroscopy is undoubtedly spatial resolution. So far this has mainly been manifest through electron energy loss spectroscopy in the 1-eV to 10-keV energy range and has not seriously challenged the dominance of optical, X-ray, and neutron spectroscopy methods over most of the vast field at lower energies. At frequencies up to a few megahertz, corresponding to energies of a few nanoelectron volts and below, direct excitation by pulsed electron beams or electric fields has proved effective. Prospects are discussed for extending spatially resolved spectroscopy to the intermediate energy region, mainly by combining the advantages of electrons with those of photons.

Sensitive, Nonintrusive,In-SituMeasurement of Temporally and Spatially Resolved Plasma Electric Fields

1984 ◽  
Vol 52 (7) ◽  
pp. 538-541 ◽  
Author(s):  
Cameron A. Moore ◽  
Glenn P. Davis ◽  
Richard A. Gottscho
Keyword(s):  
Electric Fields ◽  
Spatially Resolved

Stark spectroscopy of mixed-valence systems

2007 ◽  
Vol 366 (1862) ◽  
pp. 33-45 ◽  
Author(s):  
Lisa N Silverman ◽  
Pakorn Kanchanawong ◽  
Thomas P Treynor ◽  
Steven G Boxer
Keyword(s):  
Charge Transfer ◽  
Electric Fields ◽  
Dipole Moments ◽  
Mixed Valence ◽  
Quantitative Information ◽  
Stark Spectroscopy ◽  
Charge Transfer Transition ◽  
Band Position ◽  
Stark Effects ◽  
Intervalence Charge Transfer

Many mixed-valence systems involve two or more states with different electric dipole moments whose magnitudes depend upon the charge transfer distance and the degree of delocalization; these systems can be interconverted by excitation of an intervalence charge transfer transition. Stark spectroscopy involves the interaction between the change in dipole moment of a transition and an electric field, so the Stark spectra of mixed-valence systems are expected to provide quantitative information on the degree of delocalization. In limiting cases, a classical Stark analysis can be used, but in intermediate cases the analysis is much more complex because the field affects not only the band position but also the intrinsic bandshape. Such non-classical Stark effects lead to widely different bandshapes. Several examples of both classes are discussed. Because electric fields are applied to immobilized samples, complications arise from inhomogeneous broadening, along with other effects that limit our ability to extract unique parameters in some cases. In the case of the radical cation of the special pair in photosynthetic reaction centres, where the mixed-valence system is in a very complex but structurally well-defined environment, a detailed analysis can be performed.

Absolute Calibration of Electric Fields Using Stark Spectroscopy

1995 ◽  
Vol 75 (19) ◽  
pp. 3402-3405 ◽  
Author(s):  
G. D. Stevens ◽  
C.-H. Iu ◽  
T. Bergeman ◽  
H. J. Metcalf ◽  
I. Seipp ◽  
...  
Keyword(s):  
Electric Fields ◽  
Absolute Calibration ◽  
Stark Spectroscopy

Doppler-free Stark spectroscopy of the second excited level of atomic hydrogen for measurements of electric fields

2007 ◽  
Vol 75 (1) ◽  
Author(s):  
Minja Gemišić Adamov ◽  
Andreas Steiger ◽  
Klaus Grützmacher ◽  
Joachim Seidel
Keyword(s):  
Electric Fields ◽  
Atomic Hydrogen ◽  
Excited Level ◽  
Stark Spectroscopy

Unravelling charge separation via surface built-in electric fields within single particulate photocatalysts

2017 ◽  
Vol 198 ◽  
pp. 473-479 ◽  
Author(s):  
Ruotian Chen ◽  
Jian Zhu ◽  
Hongyu An ◽  
Fengtao Fan ◽  
Can Li
Keyword(s):  
Electric Fields ◽  
Charge Separation ◽  
Energy Conversion Efficiency ◽  
Single Particles ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Transfer Processes ◽  
Spatially Resolved ◽  
P Type

Kelvin Probe Force Microscopy (KPFM) and spatially resolved surface photovoltage (SRSPV) techniques were employed to reveal built-in electric fields and surface photogenerated charge distribution on single particulate photocatalysts. The photogenerated holes and electrons spread over the whole surface of the particulate photocatalyst are imaged on n-type BiVO4 and p-type Cu2O single particles, respectively. It is demonstrated that the built-in electric field in the surface Space Charge Region (SCR) dictates the charge separation/transfer processes and allows the drift of one kind of the photogenerated carriers to the surface, while holding another kind of the carriers in the bulk. The results emphasize the role of the SCR played in the unidirectional charge transport between the bulk and surface in the particulate photocatalyst, which may be the crucial reason for low solar energy conversion efficiency.

scholarly journals Spatially Resolved Electroluminescence of InGaN-MQW-LEDs

2000 ◽  
Vol 5 (S1) ◽  
pp. 22-27
Author(s):  
Veit Schwegler ◽  
Matthias Seyboth ◽  
Christoph Kirchner ◽  
Marcus Scherer ◽  
Markus Kamp ◽  
...  
Keyword(s):  
Electric Fields ◽  
Light Emitting ◽  
Sapphire Substrates ◽  
Spatially Resolved ◽  
Band Emission ◽  
Substrate Side ◽  
Local Fluctuations ◽  
Current Densities ◽  
Significant Measure ◽  
Spectrally Resolved

Electroluminescence (EL) is the most significant measure for light-emitting diodes since it probes the most relevant properties of the fully processed device during operation. In addition to the information gained by conventional spectrally resolved EL, scanning micro-EL provides spatially resolved information. The devices under investigation are InGaN/GaN-LEDs with single peak band-band emission at about 400 nm grown by MOVPE on sapphire substrates.The µ-EL-characterization is performed as a function of injection current densities and the emission is investigated from the epitaxial layer as well as from substrate side. Spatially resolved wavelength images reveal emission peaks between 406 nm and 417 nm, corresponding either to In fluctuations of 1 %−1.5 % or local fluctuations of piezo electric fields. Beside the information on the emission wavelength fluctuations µ-EL is used to determine the temperature distribution in the LEDs and to investigate transparent contacts.

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