scholarly journals Segmented ion-trap fabrication using high precision stacked wafers

2019 ◽  
Vol 90 (10) ◽  
pp. 103203 ◽  
Author(s):  
Simon Ragg ◽  
Chiara Decaroli ◽  
Thomas Lutz ◽  
Jonathan P. Home
Keyword(s):  
High Precision ◽  
Ion Trap

scholarly journals Probing Time Dilation in Coulomb Crystals in a High-Precision Ion Trap

2019 ◽  
Vol 11 (1) ◽  
Author(s):  
J. Keller ◽  
D. Kalincev ◽  
T. Burgermeister ◽  
A. P. Kulosa ◽  
A. Didier ◽  
...  
Keyword(s):  
High Precision ◽  
Ion Trap ◽  
Time Dilation ◽  
Coulomb Crystals

High-precision measurements in few-electron highly charged ions at the HeidelbergElectron Beam Ion Trap (EBIT)

2005 ◽  
Vol 83 (4) ◽  
pp. 387-393 ◽  
Author(s):  
J.R. Crespo López-Urrutia ◽  
J Braun ◽  
G Brenner ◽  
H Bruhns ◽  
I N Draganič ◽  
...  
Keyword(s):  
High Precision ◽  
Quantum Electrodynamics ◽  
Nuclear Physics ◽  
Ion Trap ◽  
Dielectronic Recombination ◽  
Highly Charged Ions ◽  
Precision Measurements ◽  
Excitation Energies ◽  
X Ray ◽  
Charged Ions

The research program at the Heidelberg Electron Beam Ion Trap (EBIT) has concentrated mainly on precision measurements relevant to quantum electrodynamics (QED) and nuclear physics. Spectroscopic measurements in the optical region have delivered the most accurate wavelengths ever reported for highly charged ions, extracting even isotopic shifts. The forbidden transitions of B-like Ar XIV and Be-like Ar XV ions were studied. They are especially interesting, since the QED contributions are as large as 0.2%. Improved atomic structure calculations allowed for the determination of their values with growing accuracy. The lifetimes of the corresponding metastable levels have also been measured with an uncertainty of less than 0.5% thus becoming sensitive to the influence of the bound electron anomalous magnetic moment, so far an almost experimentally unexplored QED effect. A new laser spectroscopic setup aims at facilitating future studies of the hyperfine structure of heavy hydrogenic ions. Through the study of the dielectronic recombination, information on rare processes, such as two-electron-one-photon transitions in Ar16+, or the interference effects between dielectronic and radiative recombination in Hg77+, and accurate values for the excitation energies of very heavy HCI have been obtained. A novel X-ray crystal spectrometer allowing absolute X-ray wavelength measurements in the range up to 15 keV with very high precision and reproducibility is currently used to study the Lyman series of H-like ions of medium-Z ions and the 2s–2p transitions of very heavy Li-like ions. PACS Nos.: 31.30.Jv, 32.80.Fb, 32.80.Dz, 32.30.Jv, 32.30.Rj, 95.30.Dr

scholarly journals High-precision measurements of krypton and xenon isotopes with a new static-mode quadrupole ion trap mass spectrometer

2019 ◽  
Vol 34 (1) ◽  
pp. 104-117 ◽  
Author(s):  
G. Avice ◽  
A. Belousov ◽  
K. A. Farley ◽  
S. M. Madzunkov ◽  
J. Simcic ◽  
...  
Keyword(s):  
Isotopic Composition ◽  
High Precision ◽  
Mass Spectrometer ◽  
Noble Gases ◽  
Ion Trap ◽  
Quadrupole Ion Trap ◽  
Precision Measurements ◽  
Static Mode ◽  
Ion Trap Mass Spectrometer ◽  
Xenon Isotopes

A quadrupole ion trap mass spectrometer measures precisely the abundance and isotopic composition of small amounts of noble gases.

High-precision relativistic atomic structure calculations and the EBIT: Tests of quantum electrodynamics in highly charged ions

2008 ◽  
Vol 86 (1) ◽  
pp. 33-43 ◽  
Author(s):  
K T Cheng ◽  
M H Chen ◽  
W R Johnson ◽  
J Sapirstein
Keyword(s):  
High Precision ◽  
Atomic Structure ◽  
Quantum Electrodynamics ◽  
Ion Trap ◽  
Strong Field ◽  
Energy State ◽  
Negative Energy ◽  
Configuration Interaction Method ◽  
Atomic Structure Calculations ◽  
Structure Calculations

High-precision relativistic atomic-structure calculations based on the relativistic many-body perturbation theory and the relativistic configuration-interaction method are shown to provide stringent tests of strong-field quantum electrodynamic (QED) corrections when compared with electron beam ion trap measurements of the spectra of highly charged, many-electron ions. It is further shown that theory and experiment are accurate enough to test not just the leading screened QED corrections but also smaller contributions from higher order Breit interactions, relaxed-core QED corrections, two-loop Lamb shifts, negative-energy state corrections, nuclear polarizations, and nuclear recoils. PACS Nos. 31.30.Jv, 32.30.Rj, 31.25.–v, 31.15.Ar

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

Digital differential hysteresis iimage processing displays what the microscope acquires but the eye can't see

1995 ◽  
Vol 53 ◽  
pp. 642-643
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
Image Processing ◽  
Visual System ◽  
High Precision ◽  
Image Data ◽  
Processing Technology ◽  
Output Data ◽  
Contrast Resolution ◽  
Pixel Intensity ◽  
Data Reading ◽  
Hysteresis Properties

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.

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